{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,6]],"date-time":"2026-06-06T02:04:48Z","timestamp":1780711488878,"version":"3.54.1"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2016,5,1]],"date-time":"2016-05-01T00:00:00Z","timestamp":1462060800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/tim.2016.2534199","type":"journal-article","created":{"date-parts":[[2016,3,16]],"date-time":"2016-03-16T20:21:26Z","timestamp":1458159686000},"page":"1225-1231","source":"Crossref","is-referenced-by-count":21,"title":["A Methodology to Measure Input Power and Effective Area for Characterization of Direct THz Detectors"],"prefix":"10.1109","volume":"65","author":[{"given":"Muhammad","family":"Ali","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Matteo","family":"Perenzoni","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"David","family":"Stoppa","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TTHZ.2011.2159560"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/PRIME.2011.5966222"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2011.5746211"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2011.5973456"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TTHZ.2011.2159554"},{"key":"ref15","first-page":"252","article-title":"A 1 kpixel CMOS camera chip for 25 fps real-time terahertz imaging applications","author":"sherry","year":"2012","journal-title":"Proc IEEE Int Solid-State Circuits Conf"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2021911"},{"key":"ref17","first-page":"254","article-title":"280 GHz and 860 GHz image sensors using Schottky-barrier diodes in $0.13~\\mu $ m digital CMOS","author":"han","year":"2012","journal-title":"Proc IEEE Int Solid-State Circuits Conf"},{"key":"ref18","first-page":"1","article-title":"Measurement of spatial response of CMOS antenna-coupled FET detector at 325 GHz","author":"perenzoni","year":"2014","journal-title":"Proc 36th Int Conf Infr Millim Terahertz Waves"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2015.7151287"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1038\/nphoton.2007.166"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TTHZ.2011.2159559"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2012.6341311"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2013.2243465"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2104553"},{"key":"ref7","first-page":"472","article-title":"A 410 GHz CMOS push-push oscillator with an on-chip patch antenna","author":"seok","year":"2008","journal-title":"Proc IEEE Int Solid-State Circuits Conf"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/22.989974"},{"key":"ref1","first-page":"13","article-title":"Terahertz technology: Devices and applications","author":"shur","year":"2005","journal-title":"Proc 31st Eur Solid-State Circuits Conf"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.2478\/s11772-011-0033-3"},{"key":"ref20","year":"2016","journal-title":"Horn Antennas"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.1976.1141313"},{"key":"ref21","first-page":"914106-1","article-title":"Comparison of gate driven and source driven FET structures as THz detectors","volume":"9141","author":"ali","year":"2014","journal-title":"Proc SPIE"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1364\/AO.38.003993"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/7447843\/7434606.pdf?arnumber=7434606","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:02:57Z","timestamp":1642003377000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7434606\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":23,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tim.2016.2534199","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,5]]}}}