{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T16:36:32Z","timestamp":1783701392872,"version":"3.55.0"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2016,8,1]],"date-time":"2016-08-01T00:00:00Z","timestamp":1470009600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100001665","name":"Agence Nationale de la Recherche, France, through the Project NANOROBUST","doi-asserted-by":"publisher","award":["ANR-11-NANO-006"],"award-info":[{"award-number":["ANR-11-NANO-006"]}],"id":[{"id":"10.13039\/501100001665","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004100","name":"Labex ACTION Project","doi-asserted-by":"publisher","award":["ANR-11-LABEX-01-01"],"award-info":[{"award-number":["ANR-11-LABEX-01-01"]}],"id":[{"id":"10.13039\/501100004100","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Equipex ROBOTEX Project","award":["ANR-10-EQPX-44-01"],"award-info":[{"award-number":["ANR-10-EQPX-44-01"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2016,8]]},"DOI":"10.1109\/tim.2016.2556898","type":"journal-article","created":{"date-parts":[[2016,6,20]],"date-time":"2016-06-20T23:15:50Z","timestamp":1466464550000},"page":"1847-1855","source":"Crossref","is-referenced-by-count":21,"title":["Visual Servoing-Based Depth-Estimation Technique for Manipulation Inside SEM"],"prefix":"10.1109","volume":"65","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0159-167X","authenticated-orcid":false,"given":"Naresh","family":"Marturi","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Brahim","family":"Tamadazte","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sounkalo","family":"Dembele","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Nadine","family":"Piat","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","first-page":"6","article-title":"Gluing free assembly of an advanced 3D structure using visual servoing","author":"demb\u00e9l\u00e9","year":"2012","journal-title":"Proc 23rd Micromech Microsyst Eur Workshop"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2012.04.010"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CARE.2013.6733694"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirpj.2011.03.003"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1111\/j.1365-2818.2010.03383.x"},{"key":"ref15","first-page":"70","article-title":"Autofocusing algorithm selection in computer microscopy","author":"sun","year":"2005","journal-title":"Proc IEEE\/RSJ Int Conf Intell Robots Syst"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s10851-011-0309-8"},{"key":"ref17","article-title":"Towards a predictive autofocus algorithm for SEM","volume":"24","author":"nicolls","year":"1994","journal-title":"Proceedings of Electron Microscopy Society of Southern Africa EMSSA"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IROS.2013.6696734"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1002\/sca.21137"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1177\/0278364908099849"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICRA.2014.6906973"},{"key":"ref6","first-page":"128","article-title":"3D position detection with an FIB-SEM dual beam system","author":"tunnell","year":"2011","journal-title":"Proc 10th WSEAS Int Conf Commun Elect Comput Eng"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2011.2166162"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s12213-008-0001-2"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.911580"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/19.755060"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"674","DOI":"10.1109\/TNANO.2010.2065236","article-title":"Automated four-point probe measurement of nanowires inside a scanning electron microscope","volume":"10","author":"ru","year":"2011","journal-title":"IEEE Trans Nanotechnol"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ROBOT.2009.5152440"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1163\/156856306777924644"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/7509710\/07494610.pdf?arnumber=7494610","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:43:04Z","timestamp":1641987784000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7494610\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,8]]},"references-count":20,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tim.2016.2556898","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,8]]}}}