{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:09:13Z","timestamp":1740132553094,"version":"3.37.3"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2016,10,1]],"date-time":"2016-10-01T00:00:00Z","timestamp":1475280000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/tim.2016.2579446","type":"journal-article","created":{"date-parts":[[2016,6,30]],"date-time":"2016-06-30T16:07:45Z","timestamp":1467302865000},"page":"2381-2388","source":"Crossref","is-referenced-by-count":0,"title":["Selected Problems of <inline-formula> <tex-math notation=\"LaTeX\">$k$ <\/tex-math> <\/inline-formula>-Factor Estimation Related to the IEC Flickermeter\u2019s Nonlinearity"],"prefix":"10.1109","volume":"65","author":[{"given":"Mateusz","family":"Michalski","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8780-7605","authenticated-orcid":false,"given":"Grzegorz","family":"Wiczynski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/PTC.2011.6019416"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.922088"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICHQP.2004.1409353"},{"key":"ref13","first-page":"333","article-title":"The influence of a phase change in the measured voltage on flickermeter response","author":"rog\u00f3?","year":"2004","journal-title":"Proc 11th ICHQP"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1002\/etep.103"},{"key":"ref15","first-page":"25","article-title":"Amplitude and phase modulation effects of waveform distortion in power systems","volume":"13","author":"langella","year":"2007","journal-title":"J Electr Power Quality Utilisation"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISNCC.2008.4627506"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2020837"},{"key":"ref18","first-page":"328","article-title":"Analysis of flickermeter’s signal chain for input signal with two sub\/interharmonics","volume":"86","author":"wiczy?ski","year":"2010","journal-title":"Przeglad Elektrotechniczny"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2011.2156819"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2006724"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/PTC.2005.4524419"},{"journal-title":"Power Quality Analyser PQ-Box 100 Operating Manual","year":"2011","key":"ref27"},{"journal-title":"Testing and Measurement TechniquesFlickermeterFunctional and Design Specifications","year":"2010","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2008.0429"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2006.328169"},{"year":"2007","key":"ref8"},{"journal-title":"Testing and Measurement Techniques—Power Quality Measurement Methods","year":"2015","key":"ref7"},{"journal-title":"IEV No 845-02-49 Flicker","year":"2011","key":"ref2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2006.886767"},{"journal-title":"IEV Number 161-08-14 Flickermeter","year":"2011","key":"ref1"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2171611"},{"journal-title":"IEV Number 103-07-05 Initial Phase\/Phase Angle","year":"2015","key":"ref22"},{"journal-title":"Assumptions in the Design of the NPL Reference Flickermeter and Calibration of Commercial Flickermeters","year":"2014","key":"ref21"},{"journal-title":"Agilent 33500 Series Waveform Generator—Operating and Service Guide","year":"2012","key":"ref24"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1155\/2012\/362849"},{"journal-title":"Programmable AC Source 61501\/61502\/61503\/61504 User’s Manual","year":"2004","key":"ref26"},{"journal-title":"Agilent 33503A BenchLink Waveform Builder Pro and Basic Software—Data Sheet","year":"2012","key":"ref25"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/7564374\/07502165.pdf?arnumber=7502165","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:43:39Z","timestamp":1641987819000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7502165\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":28,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tim.2016.2579446","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2016,10]]}}}