{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,13]],"date-time":"2026-07-13T10:18:17Z","timestamp":1783937897401,"version":"3.55.0"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2016,12,1]],"date-time":"2016-12-01T00:00:00Z","timestamp":1480550400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51475355"],"award-info":[{"award-number":["51475355"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61673311"],"award-info":[{"award-number":["61673311"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Young Talent Support Plan of Central Organization Department"},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"crossref","award":["2012jdgz01"],"award-info":[{"award-number":["2012jdgz01"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"crossref","award":["CXTD2014001"],"award-info":[{"award-number":["CXTD2014001"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2016,12]]},"DOI":"10.1109\/tim.2016.2601004","type":"journal-article","created":{"date-parts":[[2016,9,22]],"date-time":"2016-09-22T14:35:48Z","timestamp":1474554948000},"page":"2671-2684","source":"Crossref","is-referenced-by-count":235,"title":["A New Method Based on Stochastic Process Models for Machine Remaining Useful Life Prediction"],"prefix":"10.1109","volume":"65","author":[{"given":"Yaguo","family":"Lei","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Naipeng","family":"Li","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jing","family":"Lin","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2013.02.019"},{"key":"ref38","article-title":"PRONOSTIA: An experimental platform for bearings accelerated degradation tests","author":"nectoux","year":"0","journal-title":"IEEE Int Conf Prognostics Health Manage"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/S0262-8856(02)00133-6"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1162\/089976600300015664"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2399396"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-3437-9_12"},{"key":"ref37","year":"2016","journal-title":"IEEE PHM 2012 Prognostic Challenge Outline Experiments Scoring of results Winners"},{"key":"ref36","first-page":"4","article-title":"Metrics for offline evaluation of prognostic performance","volume":"1","author":"saxena","year":"2010","journal-title":"Int Conf Prognostics Health Manage"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.1974.1100705"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-3437-9_1"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2330494"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2169182"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s10985-005-5237-8"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2014.06.005"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2010.07.003"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2012.08.016"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1080\/15732470601012154"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2009.2026784"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2393840"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2013.2284733"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2011.10.009"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1080\/00207721.2012.659708"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2224079"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2078296"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/s131216950"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1049\/ip-f-2.1993.0015"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2012.09.015"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2015.02.016"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2013.11.012"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2013.01.017"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2327917"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2014.10.041"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1080\/07408170590929018"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.3390\/en7020520"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2299151"},{"key":"ref24","doi-asserted-by":"crossref","first-page":"557","DOI":"10.1007\/s00521-013-1520-x","article-title":"Lithium-ion battery remaining useful life estimation based on fusion nonlinear degradation AR model and RPF algorithm","volume":"25","author":"liu","year":"2013","journal-title":"Neural Comput Appl"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2455055"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/78.978374"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2010.08.009"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/7594431\/07574329.pdf?arnumber=7574329","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:39:41Z","timestamp":1641987581000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7574329\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,12]]},"references-count":39,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tim.2016.2601004","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,12]]}}}