{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,28]],"date-time":"2025-09-28T06:43:57Z","timestamp":1759041837211,"version":"3.37.3"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2016,12,1]],"date-time":"2016-12-01T00:00:00Z","timestamp":1480550400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2016,12]]},"DOI":"10.1109\/tim.2016.2610138","type":"journal-article","created":{"date-parts":[[2016,9,29]],"date-time":"2016-09-29T14:10:57Z","timestamp":1475158257000},"page":"2685-2692","source":"Crossref","is-referenced-by-count":14,"title":["A Novel Method for Phase Noise Measurement Based on Cyclic Complementary Autocorrelation"],"prefix":"10.1109","volume":"65","author":[{"given":"Mauro","family":"D'Arco","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1896-2614","authenticated-orcid":false,"given":"Luca","family":"De Vito","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2005.06.016"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TCOM.1987.1096820"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/EFTF.2016.7477759"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/NEWCAS.2014.6933998"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.21014\/acta_imeko.v4i1.155"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/78.340776"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/78.340776"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MMM.2013.2269859"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2013.2260170"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2007.898673"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TUFFC.2016.2521614"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1986.6499123"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1063\/1.1898203"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.1480458"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TUFFC.2007.207"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/FREQ.2010.5556365"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/19.948302"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.827084"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.843113"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401537"},{"journal-title":"Phase Noise and Frequency Stability in Oscillators","year":"2009","author":"rubiola","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MMM.2013.2269860"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/19\/10\/105801"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2285796"},{"year":"2009","key":"ref8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TUFFC.2005.1503969"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2360788"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/19.650819"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2412011"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.922102"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/IMS3TW.2015.7177880"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.908689"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1049\/ip-smt:20030003"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/FREQ.2004.1418466"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/IDT.2009.5404090"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.895588"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/7594431\/07579579.pdf?arnumber=7579579","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:39:41Z","timestamp":1641987581000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7579579\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,12]]},"references-count":36,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tim.2016.2610138","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2016,12]]}}}