{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,17]],"date-time":"2025-10-17T13:54:03Z","timestamp":1760709243251},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2017,5,1]],"date-time":"2017-05-01T00:00:00Z","timestamp":1493596800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/tim.2016.2625978","type":"journal-article","created":{"date-parts":[[2017,2,1]],"date-time":"2017-02-01T19:11:19Z","timestamp":1485976279000},"page":"964-973","source":"Crossref","is-referenced-by-count":10,"title":["Optimized Nanocrystalline Silicon Oxide Impedance Immunosensor Electronic Tongue for Subfemtomolar Estimation of Multiple Food Toxins"],"prefix":"10.1109","volume":"66","author":[{"given":"Hrilina","family":"Ghosh","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rahul","family":"Das","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chirasree","family":"RoyChaudhuri","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2014.06.070"},{"key":"ref11","first-page":"659","article-title":"Homogeneous electrochemical detection of ochratoxin A in foodstuff using aptamer&#x2013;graphene oxide nanosheets and DNase I-based target recycling reaction","volume":"18","author":"sun","year":"2015","journal-title":"Biosensors Bioelectron"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.4811409"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2014.09.035"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2014.09.077"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2015.2455535"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2115410"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2415113"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.proeng.2014.11.695"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2010.04.004"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2604854"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2015.01.046"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2012.10.133"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.aca.2008.11.010"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2014.01.045"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1073\/pnas.1315485111"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2012.6411191"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2015.06.069"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2012.12.022"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s00216-009-2857-y"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1039\/C5AN01602A"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2013.05.008"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2015.2496998"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2574379"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2016.7520551"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2010.03.066"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2007.912423"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.electacta.2006.07.047"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1021\/ac034694g"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/7893011\/07839257.pdf?arnumber=7839257","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:42:53Z","timestamp":1642005773000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7839257\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":29,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tim.2016.2625978","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,5]]}}}