{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,1,7]],"date-time":"2023-01-07T00:50:02Z","timestamp":1673052602403},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2017,6,1]],"date-time":"2017-06-01T00:00:00Z","timestamp":1496275200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"JSPS KAKENHI","award":["25420428","16K06403"],"award-info":[{"award-number":["25420428","16K06403"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2017,6]]},"DOI":"10.1109\/tim.2016.2637498","type":"journal-article","created":{"date-parts":[[2016,12,30]],"date-time":"2016-12-30T19:18:06Z","timestamp":1483125486000},"page":"1586-1591","source":"Crossref","is-referenced-by-count":6,"title":["Calibration of a Terahertz Attenuator by a DC Power Substitution Method"],"prefix":"10.1109","volume":"66","author":[{"given":"Hitoshi","family":"Iida","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Moto","family":"Kinoshita","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kuniaki","family":"Amemiya","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","first-page":"128004-1","DOI":"10.7567\/JJAP.50.128004","article-title":"Power linearity measurement in terahertz time-domain spectroscopy using metalized film attenuators","volume":"50","author":"iida","year":"2011","journal-title":"Jpn J Appl Phys"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2012.2208624"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2225927"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s10762-013-0042-z"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1587\/elex.13.20160532"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.6028\/NBS.MONO.97"},{"key":"ref16","author":"warner","year":"1977","journal-title":"Microwave Attenuation Measurement"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2016.7540670"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1990.1032920"},{"key":"ref19","first-page":"339","article-title":"Measurement of optical properties of a metalized-film attenuator at terahertz frequencies using a time-domain spectrometer","author":"iida","year":"2013","journal-title":"Proc of International Workshop of Optical Terahertz Science and Technology"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1364\/AO.50.004099"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1364\/OE.18.021804"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1364\/OL.39.001609"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1364\/OE.21.014466"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1364\/OL.34.000674"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s10762-014-0066-z"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/46\/4\/S06"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/46\/4\/S05"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICIMW.2009.5324721"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/22.45352"},{"key":"ref22","year":"2008","journal-title":"document JCGM 100 2008 Joint Committee for Guides in Metrology (JCGM)"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.21236\/ADA461642"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2004.305299"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/7924433\/07802555.pdf?arnumber=7802555","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:40:49Z","timestamp":1642005649000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7802555\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,6]]},"references-count":23,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2016.2637498","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,6]]}}}