{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,9,2]],"date-time":"2023-09-02T11:10:56Z","timestamp":1693653056093},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2017,6,1]],"date-time":"2017-06-01T00:00:00Z","timestamp":1496275200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"JSPS KAKENHI","award":["JP25871192"],"award-info":[{"award-number":["JP25871192"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2017,6]]},"DOI":"10.1109\/tim.2016.2637518","type":"journal-article","created":{"date-parts":[[2017,1,10]],"date-time":"2017-01-10T19:19:31Z","timestamp":1484075971000},"page":"1237-1242","source":"Crossref","is-referenced-by-count":1,"title":["Experimental Demonstration of Current Dependence Evaluation of Voltage Divider Based on Quantized Hall Resistance Voltage Divider"],"prefix":"10.1109","volume":"66","author":[{"given":"Atsushi","family":"Domae","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Takehiko","family":"Oe","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Syogo","family":"Kiryu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nobu-Hisa","family":"Kaneko","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/19.769596"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/40\/5\/302"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/19.769587"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/41\/4\/010"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2004.305569"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2100630"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2228750"},{"key":"ref17","first-page":"396","article-title":"Development of a voltage divider based on quantized Hall resistance arrays for high DC voltage standard","author":"kaneko","year":"2006","journal-title":"CPEM Conf Dig"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2016.7540762"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1063\/1.353944"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1088\/0953-2048\/21\/10\/105007"},{"key":"ref3","first-page":"5","article-title":"Voltage standards","volume":"64","author":"murayama","year":"2000","journal-title":"Bull Electrotech Lab"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/27\/3\/032001"},{"key":"ref5","doi-asserted-by":"crossref","DOI":"10.1109\/TASC.2012.2235895","article-title":"NbSi barrier junctions tuned for metrological applications up to 70 GHz: 20 V arrays for programmable Josephson voltage standards","volume":"23","author":"m\u00fcller","year":"2013","journal-title":"IEEE Trans Appl Supercond"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.811568"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.811567"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.45.494"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/0031-9163(62)91369-0"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/40\/1A\/01001"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/23\/12\/124008"},{"key":"ref22","year":"2016","journal-title":"HK HL Series Zero-TCR Ultra Precision Resistor (Hermetically Sealed) Catalogue"},{"key":"ref21","year":"1995","journal-title":"document ISO\/IEC Guide 98-3"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/52\/1\/31"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/7924433\/07812565.pdf?arnumber=7812565","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:40:49Z","timestamp":1642005649000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7812565\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,6]]},"references-count":23,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2016.2637518","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,6]]}}}