{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,2]],"date-time":"2025-10-02T06:11:48Z","timestamp":1759385508254},"reference-count":17,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2017,6,1]],"date-time":"2017-06-01T00:00:00Z","timestamp":1496275200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2017,6]]},"DOI":"10.1109\/tim.2017.2653578","type":"journal-article","created":{"date-parts":[[2017,2,24]],"date-time":"2017-02-24T19:26:00Z","timestamp":1487964360000},"page":"1560-1565","source":"Crossref","is-referenced-by-count":1,"title":["Evaluation of Automatic Coaxial Mechanical Scanners for Precise Resistance and Capacitance Measurements"],"prefix":"10.1109","volume":"66","author":[{"given":"Takehiko","family":"Oe","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Atsushi","family":"Domae","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Norihiko","family":"Sakamoto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nobu-Hisa","family":"Kaneko","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","year":"0","journal-title":"46XX Series of High Resistance Scanners"},{"key":"ref11","year":"0","journal-title":"Multi-Mechanical Scanner TYPE 3116M"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2000.850992"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2012.6250951"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1966.4313542"},{"key":"ref15","author":"kibble","year":"1984","journal-title":"Coaxial AC Bridges"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.5571\/syntheng.3.214"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2016.7540786"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1541\/ieejfms.126.1183"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1063\/1.1149810"},{"key":"ref6","first-page":"270","article-title":"Automation of 1 T\n$\\Omega $\n to 100 T\n$\\Omega $\n ultra-high-resistance measurements at NIST","author":"jarrett","year":"2008","journal-title":"CPEM Conf Dig"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2008.4574739"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2534278"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/24\/2\/025008"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/19.772194"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1990.1032953"},{"key":"ref9","year":"0","journal-title":"Guildline Instruments Model 6564 Series 8 and 16-Channel High to Ultra-High Resistance Scanners"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/7924433\/07864404.pdf?arnumber=7864404","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:39:02Z","timestamp":1642005542000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7864404\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,6]]},"references-count":17,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2017.2653578","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,6]]}}}