{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,4]],"date-time":"2022-04-04T04:14:19Z","timestamp":1649045659382},"reference-count":11,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2017,6,1]],"date-time":"2017-06-01T00:00:00Z","timestamp":1496275200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2017,6]]},"DOI":"10.1109\/tim.2017.2653599","type":"journal-article","created":{"date-parts":[[2017,2,1]],"date-time":"2017-02-01T19:11:19Z","timestamp":1485976279000},"page":"1621-1627","source":"Crossref","is-referenced-by-count":1,"title":["Development of S-Parameter Calibration System for Type-N, $75-\\Omega$ Connector Below 12 GHz"],"prefix":"10.1109","volume":"66","author":[{"given":"Masahiro","family":"Horibe","sequence":"first","affiliation":[]},{"given":"Ryoko","family":"Kishikawa","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","year":"0","journal-title":"SMPTE Standard—12 Gb\/s Signal\/Data Serial Interface—Electrical"},{"key":"ref3","year":"2006","journal-title":"Radio-Frequency Connectors—Part 16 Sectional Specification—RF Coaxial Connectors With Inner Diameter of Outer Conductor 7 mm (0 276 in) With Screw Coupling—Characteristics Impedance 50 Ohms (75 Ohms) (Type N)"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.891050"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2008084"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.843521"},{"key":"ref5","year":"2015","journal-title":"Receiver for Advanced Wide Band Digital Satellite Broadcasting"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.6028\/jres.094.015"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1979.1129778"},{"key":"ref2","year":"2007"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1967.1126520"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2016.7540752"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/7924433\/07839204.pdf?arnumber=7839204","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:39:03Z","timestamp":1642005543000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7839204\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,6]]},"references-count":11,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2017.2653599","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,6]]}}}