{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,12]],"date-time":"2026-05-12T11:46:43Z","timestamp":1778586403115,"version":"3.51.4"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2017,7,1]],"date-time":"2017-07-01T00:00:00Z","timestamp":1498867200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61374018"],"award-info":[{"award-number":["61374018"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2017,7]]},"DOI":"10.1109\/tim.2017.2664458","type":"journal-article","created":{"date-parts":[[2017,3,1]],"date-time":"2017-03-01T19:11:26Z","timestamp":1488395486000},"page":"1751-1759","source":"Crossref","is-referenced-by-count":35,"title":["Image Recovery for Electrical Capacitance Tomography Based on Low-Rank Decomposition"],"prefix":"10.1109","volume":"66","author":[{"given":"Jiamin","family":"Ye","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Haigang","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wuqiang","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"703","article-title":"Robust photometric stereo via low-rank matrix completion and recovery","volume":"6494","author":"wu","year":"0","journal-title":"Vision Computer"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1137\/090761793"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/1970392.1970395"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1002\/mrm.25240"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1118\/1.4915543"},{"key":"ref15","article-title":"Denoising multi-channel images in parallel MRI by low rank matrix decomposition","volume":"24","author":"xu","year":"2014","journal-title":"IEEE Trans Appl Supercond"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1117\/1.JBO.19.5.056007"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1088\/1612-2011\/10\/3\/035603"},{"key":"ref18","article-title":"The augmented Lagrange multiplier method for exact recovery of corrupted low-rank matrices","author":"lin","year":"2009"},{"key":"ref19","author":"boyd","year":"2011","journal-title":"Distributed optimization and statistical learning via the alternating direction method of multipliers"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"89","DOI":"10.1109\/TIM.2014.2329738","article-title":"Image reconstruction for electrical capacitance tomography based on sparse representation","volume":"64","author":"ye","year":"2015","journal-title":"IEEE Trans Instrum Meas"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/5.5962"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/14\/1\/201"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2012.2192261"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.apm.2015.02.036"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2015.2506409"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/10\/11\/315"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.4872083"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2011.2174438"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/27\/7\/074003"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1049\/ip-smt:19990008"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/21\/4\/042001"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2012.2193117"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/13\/1\/314"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/42.730401"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/7942181\/07867067.pdf?arnumber=7867067","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:15:04Z","timestamp":1642004104000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7867067\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,7]]},"references-count":25,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tim.2017.2664458","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,7]]}}}