{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,29]],"date-time":"2026-03-29T21:37:33Z","timestamp":1774820253298,"version":"3.50.1"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2017,7,1]],"date-time":"2017-07-01T00:00:00Z","timestamp":1498867200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61273164"],"award-info":[{"award-number":["61273164"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61433004"],"award-info":[{"award-number":["61433004"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61473069"],"award-info":[{"award-number":["61473069"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61673093"],"award-info":[{"award-number":["61673093"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61627809"],"award-info":[{"award-number":["61627809"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61621004"],"award-info":[{"award-number":["61621004"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2017,7]]},"DOI":"10.1109\/tim.2017.2673024","type":"journal-article","created":{"date-parts":[[2017,3,15]],"date-time":"2017-03-15T04:58:22Z","timestamp":1489553902000},"page":"1883-1892","source":"Crossref","is-referenced-by-count":148,"title":["Injurious or Noninjurious Defect Identification From MFL Images in Pipeline Inspection Using Convolutional Neural Network"],"prefix":"10.1109","volume":"66","author":[{"given":"Jian","family":"Feng","sequence":"first","affiliation":[]},{"given":"Fangming","family":"Li","sequence":"additional","affiliation":[]},{"given":"Senxiang","family":"Lu","sequence":"additional","affiliation":[]},{"given":"Jinhai","family":"Liu","sequence":"additional","affiliation":[]},{"given":"Dazhong","family":"Ma","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1371\/journal.pcbi.0040027"},{"key":"ref38","first-page":"1","article-title":"Nonlinear image representation using divisive normalization","author":"lyu","year":"2008","journal-title":"Proc IEEE Conf Comput Vis Pattern Recognit"},{"key":"ref33","first-page":"592","article-title":"Improved gray-color transform method for MFL images","volume":"55","author":"peng","year":"2015","journal-title":"J Tsinghua Univ"},{"key":"ref32","first-page":"215","author":"orazem","year":"2014","journal-title":"Underground Pipeline Corrosion"},{"key":"ref31","doi-asserted-by":"crossref","first-page":"1610","DOI":"10.1109\/TNN.2010.2066286","article-title":"Human tracking using convolutional neural networks","volume":"21","author":"fan","year":"2010","journal-title":"IEEE Trans Neural Netw"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2015.2438008"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2009.5459469"},{"key":"ref36","first-page":"1","article-title":"Rectified linear units improve restricted boltzmann machines","author":"nair","year":"2010","journal-title":"Proc Int Conf Mach Learn"},{"key":"ref35","first-page":"315","article-title":"Deep sparse rectiler neural networks","author":"glorot","year":"2011","journal-title":"Proc Int Conf Artif Intell Statist"},{"key":"ref34","year":"2016","journal-title":"Convolutional neural network"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2200409"},{"key":"ref40","first-page":"1106","article-title":"ImageNet classification with deep convolutional neural networks","author":"krizhevsky","year":"2012","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2009.2020160"},{"key":"ref12","year":"2016","journal-title":"Standard Terminology for Nondestructive Examinations"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2015.2427272"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/CISP.2009.5304456"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2009.2037008"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2012.2208119"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1784\/insi.2016.58.7.380"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2014.0173"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2008.921842"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/72.554195"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1986.6831780"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2015.2389824"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/1674-1056\/22\/1\/018103"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2272842"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICPR.1994.576881"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2009.2012486"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2005.03.001"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/19.65819"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2006.880091"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.839750"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1063\/1.1558693"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2000.861437"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCI.2016.2532323"},{"key":"ref21","first-page":"745","article-title":"The research on defect recognition method for rail magnetic flux leakage detecting","author":"gao","year":"2012","journal-title":"Proc Int Conf Meas Inf Control"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2014.2360798"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TNN.2006.879766"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2016.2584107"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2014.2325781"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/7942181\/07878530.pdf?arnumber=7878530","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:15:04Z","timestamp":1642004104000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7878530\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,7]]},"references-count":40,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tim.2017.2673024","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,7]]}}}