{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,9]],"date-time":"2026-07-09T15:50:52Z","timestamp":1783612252183,"version":"3.55.0"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2017,5,1]],"date-time":"2017-05-01T00:00:00Z","timestamp":1493596800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/tim.2017.2682738","type":"journal-article","created":{"date-parts":[[2017,3,30]],"date-time":"2017-03-30T20:18:56Z","timestamp":1490905136000},"page":"935-943","source":"Crossref","is-referenced-by-count":48,"title":["Magnetic Field Analysis for 3-D Positioning Applications"],"prefix":"10.1109","volume":"66","author":[{"given":"Valter","family":"Pasku","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Alessio","family":"De Angelis","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Guido","family":"De Angelis","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Antonio","family":"Moschitta","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Paolo","family":"Carbone","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2124850"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2540938"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2608425"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2010.2047651"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1063\/1.4876480"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1063\/1.4813275"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1063\/1.3509392"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2381353"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2499251"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2012.2213240"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2270919"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/25\/10\/105101"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2004.833512"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IPIN.2012.6418863"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MAP.2014.6931676"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2015.2488361"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IPIN.2016.7743655"},{"key":"ref28","author":"jackson","year":"1975","journal-title":"Classical Electrodynamics"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/SysEng.2015.7302503"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSAC.2015.2430518"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICIII.2011.130"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/INFCOM.2007.147"},{"key":"ref29","volume":"1","author":"balanis","year":"2005","journal-title":"Antenna Theory Analysis and Design"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IPIN.2012.6418728"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CONIELECOMP.2011.5749373"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DASC.2009.95"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/WF-IoT.2014.6803131"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/UPINLBS.2010.5653681"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s11370-015-0169-y"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IPIN.2016.7743597"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/IPIN.2016.7743628"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/IPIN.2016.7743588"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/IPIN.2016.7743678"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/IPIN.2016.7743638"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2012.2188537"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2016.7520456"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/7893011\/07890423.pdf?arnumber=7890423","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:27:49Z","timestamp":1642004869000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7890423\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":36,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tim.2017.2682738","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,5]]}}}