{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,29]],"date-time":"2026-04-29T22:05:33Z","timestamp":1777500333656,"version":"3.51.4"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2017,10,1]],"date-time":"2017-10-01T00:00:00Z","timestamp":1506816000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61503376"],"award-info":[{"award-number":["61503376"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61227804"],"award-info":[{"award-number":["61227804"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61303177"],"award-info":[{"award-number":["61303177"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61421004"],"award-info":[{"award-number":["61421004"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"spe-cial fund of Jiangsu Province for the transformation of scientific and technological achievements","award":["BA2015144"],"award-info":[{"award-number":["BA2015144"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/tim.2017.2709561","type":"journal-article","created":{"date-parts":[[2017,7,14]],"date-time":"2017-07-14T14:28:24Z","timestamp":1500042504000},"page":"2725-2735","source":"Crossref","is-referenced-by-count":24,"title":["A Robust Detection Method of Control Points for Calibration and Measurement With Defocused Images"],"prefix":"10.1109","volume":"66","author":[{"given":"Wendong","family":"Ding","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xilong","family":"Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"De","family":"Xu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dapeng","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhengtao","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/34.683782"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2014.6825388"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/19.676732"},{"key":"ref31","doi-asserted-by":"crossref","first-page":"2530","DOI":"10.1109\/TIM.2015.2415092","article-title":"A novel and effective surface flaw inspection instrument for large-aperture optical elements","volume":"64","author":"tao","year":"2015","journal-title":"IEEE Trans Instrum Meas"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2022392"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TASSP.1976.1162770"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2013.2279316"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2007.383465"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-88458-3_41"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-24672-5_41"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCVW.2009.5457474"},{"key":"ref12","first-page":"694","article-title":"Robust camera calibration using neural network","author":"jun","year":"1999","journal-title":"Proc IEEE Region 10 Conf"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.1999.791257"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/S0262-8856(02)00051-3"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/34.544080"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICPR.2006.191"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.101"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2324792"},{"key":"ref19","first-page":"1115","article-title":"Robust camera calibration with epipolar constraints","volume":"2","author":"hu","year":"2004","journal-title":"Proc 7th Int Conf Signal Process (ICSP)"},{"key":"ref28","doi-asserted-by":"crossref","first-page":"1874","DOI":"10.1109\/TIM.2009.2030875","article-title":"Noncontact 3-D coordinate measurement of cross-cutting feature points on the surface of a large-scale workpiece based on the machine vision method","volume":"59","author":"zhu","year":"2010","journal-title":"IEEE Trans Instrum Meas"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TRO.2009.2012342"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2031344"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.1989.37893"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.14358\/PERS.81.2.103"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2028222"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICRA.2014.6906584"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/34.888718"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/0021-9290(94)90024-8"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2008.4587793"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-10593-2_50"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2006.05.006"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CISP.2012.6469727"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.1997.609468"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2011.03.009"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JRA.1987.1087109"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/34.291450"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.925016"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2011.6126266"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8036337\/07981379.pdf?arnumber=7981379","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:39:38Z","timestamp":1641987578000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7981379\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":38,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tim.2017.2709561","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,10]]}}}