{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,31]],"date-time":"2026-07-31T18:53:27Z","timestamp":1785524007905,"version":"3.56.0"},"reference-count":46,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2017,12,1]],"date-time":"2017-12-01T00:00:00Z","timestamp":1512086400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Basic Research Program of China","doi-asserted-by":"crossref","award":["2014CB239502"],"award-info":[{"award-number":["2014CB239502"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2017,12]]},"DOI":"10.1109\/tim.2017.2730981","type":"journal-article","created":{"date-parts":[[2017,10,25]],"date-time":"2017-10-25T14:01:31Z","timestamp":1508940091000},"page":"3316-3326","source":"Crossref","is-referenced-by-count":65,"title":["Inversion Algorithm to Calculate Charge Density on Solid Dielectric Surface Based on Surface Potential Measurement"],"prefix":"10.1109","volume":"66","author":[{"given":"Boya","family":"Zhang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wenqiang","family":"Gao","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhe","family":"Qi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Qiang","family":"Wang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3990-6024","authenticated-orcid":false,"given":"Guixin","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2014.6740759"},{"key":"ref38","author":"schaffert","year":"1965","journal-title":"Electrophotography"},{"key":"ref33","author":"pratt","year":"1987","journal-title":"Digital Image Processing"},{"key":"ref32","year":"2005","journal-title":"Regularization Methods and Application of Ill-posed Problems"},{"key":"ref31","author":"lawson","year":"1974","journal-title":"Solving Least Squares Problems"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2017.006067"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2007.899289"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1137\/1034115"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1145\/1015330.1015435"},{"key":"ref34","author":"tikhonov","year":"1977","journal-title":"Solution of Ill-Posed Problems"},{"key":"ref10","first-page":"414","article-title":"On the Electrostatic field near the charged surface of an insulator with special reference to surface charge probe measurement","author":"pedersen","year":"1984","journal-title":"Gaseous Dielectrics IV"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/B978-0-08-034693-9.50034-4"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2012.6311522"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IAS.1993.299093"},{"key":"ref13","first-page":"1","article-title":"Electric field computation from probe measurements of charge on spacers subjected to impulse voltages","author":"sudhakar","year":"1987","journal-title":"Proc Int Symp High Voltage Engineering"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/61.4242"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/B978-0-08-034693-9.50033-2"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/94.556558"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2003.1194112"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1002\/eej.20412"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2012.6148513"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1088\/0950-7671\/44\/7\/308"},{"key":"ref28","first-page":"130","article-title":"The accumulation characteristic of surface charges on GIS Insulator under switching impulse voltages in SF6","author":"qi","year":"2015","journal-title":"Proc IEEE Conf Elect Insul Dielectr Phenomena"},{"key":"ref3","first-page":"168","article-title":"De nova methodo naturam ac motum fluidi electrici investigandi","volume":"8","author":"lichtenberg","year":"1777","journal-title":"Akademie der Wissernschaften Göttingen Phys Math K1 Novi Commentarii"},{"key":"ref27","first-page":"81","article-title":"Measurement and modeling of surface charge accumulation on insulators in HVDC GIL","volume":"3","author":"zhang","year":"2015","journal-title":"Cigre Science & Engineering"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/94.708264"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3735\/2\/5\/307"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/CEIDP.2016.7785506"},{"key":"ref8","first-page":"474","article-title":"Oberflächcnladungen bei rotatians-symmetrischen isolierstoffkörpern","volume":"97","author":"specht","year":"1976","journal-title":"ETZ-A"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1063\/1.1748947"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2012.6215116"},{"key":"ref9","first-page":"566","author":"christophrou","year":"1982","journal-title":"Gaseous Dielectrics III"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/94.841816"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1063\/1.4712600"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1088\/1009-0630\/13\/6\/02"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1063\/1.4978001"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2004.1387815"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2004.1266325"},{"key":"ref42","year":"2017","journal-title":"Electrostatic Voltmeter Solutions Brochure"},{"key":"ref24","first-page":"1895","article-title":"Influence of tiny metal particles on charge accumulation phenomena of GIS model spacer in high-pressure SF6 gas","volume":"22","author":"iwabuchi","year":"2013","journal-title":"IEEE Trans Dielectr Electr Insul"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2011.6032850"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1002\/eej.22272"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2008.4591214"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/CEIDP.2016.7785563"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-8963-5"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1063\/1.4937626"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8089055\/08068244.pdf?arnumber=8068244","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T17:02:37Z","timestamp":1642006957000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8068244\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,12]]},"references-count":46,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tim.2017.2730981","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,12]]}}}