{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,6]],"date-time":"2026-02-06T00:27:15Z","timestamp":1770337635764,"version":"3.49.0"},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2017,12,1]],"date-time":"2017-12-01T00:00:00Z","timestamp":1512086400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51677091"],"award-info":[{"award-number":["51677091"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004608","name":"Excellent Youth Fund Project of Jiangsu Natural Science Foundation","doi-asserted-by":"publisher","award":["BK20160086"],"award-info":[{"award-number":["BK20160086"]}],"id":[{"id":"10.13039\/501100004608","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Six Talents Peak Project of Jiangsu Province","award":["XNY-033"],"award-info":[{"award-number":["XNY-033"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2017,12]]},"DOI":"10.1109\/tim.2017.2749838","type":"journal-article","created":{"date-parts":[[2017,9,22]],"date-time":"2017-09-22T18:13:57Z","timestamp":1506104037000},"page":"3190-3199","source":"Crossref","is-referenced-by-count":44,"title":["Noninvasive Online Condition Monitoring of Output Capacitor\u2019s ESR and C for a Flyback Converter"],"prefix":"10.1109","volume":"66","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4175-0962","authenticated-orcid":false,"given":"Kai","family":"Yao","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cheng","family":"Cao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Siwen","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2011.0163"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/SPIN.2014.6777058"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2383436"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2418198"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2472459"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2015.0636"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2550527"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2015.0821"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2581156"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2582470"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1051\/epjap:1999112"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/63.261004"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2007.903975"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/PESC.2004.1354771"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2032960"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2019719"},{"key":"ref2","year":"2006","journal-title":"Application Guide Aluminum Electrolytic Capacitors"},{"key":"ref1","year":"2002","journal-title":"Aluminium Electrolyt Capacitors - General Technical Information"},{"key":"ref9","first-page":"63","article-title":"Accelerated ageing tests for predicting capacitor lifetimes","author":"j\u00e1n\u00f3","year":"2011","journal-title":"Proc IEEE 17th Int Symp Des Technol Electron Packag (SIITME)"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2552039"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2691048"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2674598"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8089055\/08048608.pdf?arnumber=8048608","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T17:02:37Z","timestamp":1642006957000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8048608\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,12]]},"references-count":22,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tim.2017.2749838","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,12]]}}}