{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,15]],"date-time":"2026-06-15T15:39:46Z","timestamp":1781537986569,"version":"3.54.5"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T00:00:00Z","timestamp":1514764800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2018,1]]},"DOI":"10.1109\/tim.2017.2761239","type":"journal-article","created":{"date-parts":[[2017,11,3]],"date-time":"2017-11-03T18:07:48Z","timestamp":1509732468000},"page":"78-89","source":"Crossref","is-referenced-by-count":148,"title":["A Modified S-Transform and Random Forests-Based Power Quality Assessment Framework"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5517-433X","authenticated-orcid":false,"given":"Motakatla","family":"Venkateswara Reddy","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ranjana","family":"Sodhi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2009.10.013"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2007.911125"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/IEEESTD.1995.79050"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2211474"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2248335"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2015.2397431"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2540866"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/78.492555"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2016.01.003"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2258761"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2578518"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2003.814991"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1186\/1687-6180-2012-49"},{"key":"ref28","author":"bernstein","year":"2017","journal-title":"Random Forests"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2027769"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1023\/A:1010933404324"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2115610"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2016.2624313"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2356639"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2014.2377775"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.925345"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/83.535850"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/19.769633"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2020835"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/28.502175"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.928111"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2011.0202"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1155\/2008\/672941"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2272276"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2015.07.003"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2013.02.012"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2521615"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8169260\/08094878.pdf?arnumber=8094878","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:24:37Z","timestamp":1642004677000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8094878\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,1]]},"references-count":32,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tim.2017.2761239","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,1]]}}}