{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,25]],"date-time":"2025-10-25T12:26:12Z","timestamp":1761395172665,"version":"3.37.3"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2018,4,1]],"date-time":"2018-04-01T00:00:00Z","timestamp":1522540800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61273059","61425003"],"award-info":[{"award-number":["61273059","61425003"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"crossref","award":["N140404021","N130104002","N160406004"],"award-info":[{"award-number":["N140404021","N130104002","N160406004"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100011248","name":"State Key Laboratory of Synthetical Automation for Process Industries","doi-asserted-by":"crossref","award":["2013ZCX09"],"award-info":[{"award-number":["2013ZCX09"]}],"id":[{"id":"10.13039\/501100011248","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2018,4]]},"DOI":"10.1109\/tim.2017.2789098","type":"journal-article","created":{"date-parts":[[2018,1,30]],"date-time":"2018-01-30T19:15:48Z","timestamp":1517339748000},"page":"965-970","source":"Crossref","is-referenced-by-count":17,"title":["Simultaneous Measurement of Electric Field and Strain With a Tandem-Interferometric Device"],"prefix":"10.1109","volume":"67","author":[{"given":"Xue-Gang","family":"Li","sequence":"first","affiliation":[]},{"given":"Ya-Nan","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"Xue","family":"Zhou","sequence":"additional","affiliation":[]},{"given":"Lu","family":"Cai","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2015.07.014"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2594021"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2012.2232290"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1038\/srep15802"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1002\/mop.25789"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1063\/1.1796533"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1364\/AO.50.002628"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/LPT.2011.2107319"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/LPT.2004.842793"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2584390"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2188876"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2440553"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2211431"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2216549"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2232310"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2212915"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2360804"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2130010"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2115470"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2670067"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2013.07.082"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2015.06.148"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JLT.2014.2375896"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8309486\/08274959.pdf?arnumber=8274959","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:22:59Z","timestamp":1642004579000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8274959\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,4]]},"references-count":23,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tim.2017.2789098","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2018,4]]}}}