{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,10]],"date-time":"2026-02-10T06:41:29Z","timestamp":1770705689165,"version":"3.49.0"},"reference-count":44,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2018,4,1]],"date-time":"2018-04-01T00:00:00Z","timestamp":1522540800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2018,4]]},"DOI":"10.1109\/tim.2018.2790498","type":"journal-article","created":{"date-parts":[[2018,1,24]],"date-time":"2018-01-24T19:18:45Z","timestamp":1516821525000},"page":"849-865","source":"Crossref","is-referenced-by-count":44,"title":["Automatic Fault Detection of Multiple Targets in Railway Maintenance Based on Time-Scale Normalization"],"prefix":"10.1109","volume":"67","author":[{"given":"Shengfang","family":"Lu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhen","family":"Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuan","family":"Shen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"crossref","first-page":"6","DOI":"10.1016\/j.optlaseng.2015.01.009","article-title":"Automated inspection of micro-defect recognition system for color filter","volume":"70","author":"kuo","year":"2015","journal-title":"Opt Lasers Eng"},{"key":"ref38","first-page":"64","author":"sobel","year":"1970","journal-title":"Camera Models and Machine Perception"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2006.885448"},{"key":"ref32","doi-asserted-by":"crossref","first-page":"2530","DOI":"10.1109\/TIM.2015.2415092","article-title":"A novel and effective surface flaw inspection instrument for large-aperture optical elements","volume":"64","author":"tao","year":"2015","journal-title":"IEEE Trans Instrum Meas"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2184959"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/70.210796"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.pisc.2016.04.064"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2014.02.136"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2004.01.008"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2283741"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCC.2007.893278"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/RAECS.2014.6799537"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1364\/AO.55.008395"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2015.2497256"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2012.2236555"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/41.767075"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2002.807688"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2002.807650"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.jvcir.2013.02.005"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3390\/rs8050426"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/S1361-8415(01)80026-8"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1145\/2422956.2422960"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2218677"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2006.264"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2119110"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2016.2594288"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/41.43014"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2017.2696748"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.1930.896476"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2005.851648"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2479101"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1364\/AO.50.003658"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2014.6825388"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/S0262-8856(03)00137-9"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1023\/B:VISI.0000029664.99615.94"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1561\/0600000009"},{"key":"ref42","first-page":"21","article-title":"SSD: Single shot MultiBox detector","author":"liu","year":"2016","journal-title":"Proc ECCV"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2013.2251650"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1007\/s00138-007-0109-8"},{"key":"ref23","first-page":"ii-506","article-title":"PCA-SIFT: A more distinctive representation for local image descriptors","author":"ke","year":"2004","journal-title":"Proc Conf Comput Vis Pattern Recognit"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1016\/j.cviu.2007.09.014"},{"key":"ref26","first-page":"812","article-title":"Enhancing RANSAC by generalized model optimization","volume":"2","author":"chum","year":"2004","journal-title":"Proc ACCV"},{"key":"ref43","first-page":"325","author":"bishop","year":"2006","journal-title":"Pattern Recognition and Machine Learning"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2003.1238663"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8309486\/08268578.pdf?arnumber=8268578","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:13:26Z","timestamp":1642004006000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8268578\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,4]]},"references-count":44,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tim.2018.2790498","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,4]]}}}