{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,5]],"date-time":"2026-06-05T09:17:18Z","timestamp":1780651038053,"version":"3.54.1"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2018,5,1]],"date-time":"2018-05-01T00:00:00Z","timestamp":1525132800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/100016019","name":"Free State of Thuringia","doi-asserted-by":"crossref","id":[{"id":"10.13039\/100016019","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100004895","name":"European Social Fund","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004895","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1109\/tim.2018.2794940","type":"journal-article","created":{"date-parts":[[2018,2,9]],"date-time":"2018-02-09T19:22:31Z","timestamp":1518204151000},"page":"1132-1141","source":"Crossref","is-referenced-by-count":31,"title":["High-Precision Measurement of Sine and Pulse Reference Signals Using Software-Defined Radio"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4795-3517","authenticated-orcid":false,"given":"Carsten","family":"Andrich","sequence":"first","affiliation":[{"name":"Fraunhofer Institute for Integrated Circuits IIS, Ilmenau, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Alexander","family":"Ihlow","sequence":"additional","affiliation":[{"name":"Fraunhofer Institute for Integrated Circuits IIS, Ilmenau, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Julia","family":"Bauer","sequence":"additional","affiliation":[{"name":"Fraunhofer Institute for Integrated Circuits IIS, Ilmenau, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Niklas","family":"Beuster","sequence":"additional","affiliation":[{"name":"Fraunhofer Institute for Integrated Circuits IIS, Ilmenau, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Giovanni","family":"Del Galdo","sequence":"additional","affiliation":[{"name":"Fraunhofer Institute for Integrated Circuits IIS, Ilmenau, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MMM.2010.936493"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.1959.5222693"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TASSP.1981.1163535"},{"key":"ref13","author":"doolittle","year":"2010","journal-title":"Filtering and Decimation by Eight in an FPGA for SDR and Other Applications"},{"key":"ref14","year":"2018","journal-title":"USRP DDC Verilog Source Code"},{"key":"ref15","volume":"15","year":"0"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/5.84972"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1021\/ac60214a047"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/FREQ.2003.1275109"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2564038"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2014.6860842"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/41\/1\/004"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.895588"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"404","DOI":"10.1109\/FREQ.1975.200112","article-title":"picosecond time difference measurement system","author":"allan","year":"1975","journal-title":"29th Annual Symposium on Frequency Control"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2017.7969657"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1063\/1.4950898"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/FCS.2016.7563588"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.6028\/NIST.SP.1065"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IEEESTD.2011.6111219"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/EFTF.2014.7331544"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8332003\/08288589.pdf?arnumber=8288589","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T08:24:43Z","timestamp":1643185483000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8288589\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,5]]},"references-count":20,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tim.2018.2794940","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,5]]}}}