{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,8]],"date-time":"2025-11-08T13:06:10Z","timestamp":1762607170305,"version":"3.37.3"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2018,6,1]],"date-time":"2018-06-01T00:00:00Z","timestamp":1527811200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"crossref","award":["2017YFF0204704"],"award-info":[{"award-number":["2017YFF0204704"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2018,6]]},"DOI":"10.1109\/tim.2018.2795847","type":"journal-article","created":{"date-parts":[[2018,2,7]],"date-time":"2018-02-07T19:15:15Z","timestamp":1518030915000},"page":"1370-1379","source":"Crossref","is-referenced-by-count":17,"title":["A New Dual-Channel Measurement Method for Accurate Characterization of Low-Permittivity and Low-Loss Materials"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5125-8381","authenticated-orcid":false,"given":"Xu","family":"Hao","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Liang","family":"Weijun","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gao","family":"Qiulai","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/19.177336"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/22.552032"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.2528\/PIER09041405"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2008.2011242"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.2528\/PIERM15073010"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1063\/1.4948388"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2016.2606389"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2549718"},{"journal-title":"Microwave Attenuation Measurement","year":"1977","author":"warner","key":"ref18"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1970.4313932"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1038\/srep17019"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2401231"},{"article-title":"A guide to the characterisation of dielectric materials at RF and microwave frequencies","year":"2003","author":"clarke","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2619958"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/19.816109"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1002\/0470020466"},{"journal-title":"Transmission\/Reflection and Short-circuit Line Methods for Measuring Permittivity and Permeability","year":"1992","author":"baker-jarvis","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/17\/6\/R01"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.4862047"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1974.9382"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/49\/6\/809"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.2528\/PIERB07102001"},{"journal-title":"Evaluation of Measurement Data—Supplement 1 to the ‘Guide to the Expression of Uncertainty in Measurement’—Propagation of Distributions Using a Monte Carlo Method","year":"2008","key":"ref24"},{"journal-title":"Calibration and Measurement Capabilities","year":"2010","key":"ref23"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8357403\/08283807.pdf?arnumber=8283807","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:12:28Z","timestamp":1642003948000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8283807\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,6]]},"references-count":24,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2018.2795847","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2018,6]]}}}