{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,27]],"date-time":"2025-07-27T07:42:23Z","timestamp":1753602143270,"version":"3.37.3"},"reference-count":21,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2018,6,1]],"date-time":"2018-06-01T00:00:00Z","timestamp":1527811200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2018,6]]},"DOI":"10.1109\/tim.2018.2799278","type":"journal-article","created":{"date-parts":[[2018,2,13]],"date-time":"2018-02-13T19:19:25Z","timestamp":1518549565000},"page":"1425-1433","source":"Crossref","is-referenced-by-count":3,"title":["Complex Transmission Coefficient Measurement at 50\u2013110 GHz With Hybrid-Channel Measurement System"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1915-4312","authenticated-orcid":false,"given":"Qiulai","family":"Gao","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Weijun","family":"Liang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hao","family":"Xu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yong","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2045944"},{"key":"ref11","first-page":"1603","article-title":"A millimeter-wave attenuation measurement standard from 26.5 GHz to 40 GHz","author":"wu","year":"2009","journal-title":"Proc 39th Eur Microw Conf"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/el.2011.2066"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2012.01.030"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2549718"},{"key":"ref15","first-page":"5-1","article-title":"The accurate measurement of attenuation and phase","author":"kilby","year":"1994","journal-title":"Proc IEE Colloq New Microw Meas"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1049\/el.2011.1200"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1049\/el.2011.3351"},{"key":"ref18","first-page":"193","article-title":"Analysis on the cross-talk of the dual-channel attenuation measurement system","volume":"36","author":"qiulai","year":"2015","journal-title":"ACTA Metrologica Sinica"},{"key":"ref19","first-page":"61","article-title":"A new developed national attenuation standard","volume":"25","author":"gao","year":"2004","journal-title":"ACTA Metrologica Sinica"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1978.4314613"},{"year":"2000","key":"ref3","article-title":"Guidelines on the evaluation of vector network analysers (VNA)"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1049\/pi-b-2.1962.0132"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IRE-I.1960.5006920"},{"key":"ref8","first-page":"1580","article-title":"Dual channel IF substitution measurement system for microwave attenuation","volume":"e86 c","author":"widarta","year":"2003","journal-title":"IEICE Trans Electron"},{"key":"ref7","first-page":"29","article-title":"The UK national standards of RF and microwave attenuation—A review","author":"thompson","year":"2005","journal-title":"Proc Brit Electromagn Meas Conf"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTGF.2004.1427566"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.2008.4804283"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.891133"},{"journal-title":"Microwave Attenuation Measurement","year":"1977","author":"warner","key":"ref20"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1049\/ip-h-1.1981.0007"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8357403\/08291007.pdf?arnumber=8291007","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:12:28Z","timestamp":1642003948000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8291007\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,6]]},"references-count":21,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2018.2799278","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2018,6]]}}}