{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,16]],"date-time":"2026-06-16T09:31:51Z","timestamp":1781602311535,"version":"3.54.5"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2018,6,1]],"date-time":"2018-06-01T00:00:00Z","timestamp":1527811200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2018,6]]},"DOI":"10.1109\/tim.2018.2800238","type":"journal-article","created":{"date-parts":[[2018,2,16]],"date-time":"2018-02-16T19:21:16Z","timestamp":1518808876000},"page":"1461-1469","source":"Crossref","is-referenced-by-count":11,"title":["A Test Structure for the EMC Characterization of Small Integrated Circuits"],"prefix":"10.1109","volume":"67","author":[{"given":"Michele","family":"Perotti","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7159-0322","authenticated-orcid":false,"given":"Franco","family":"Fiori","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/15.974643"},{"key":"ref11","first-page":"1","article-title":"IC-stripline: A new proposal for susceptibility and emission testing of ICs","author":"koerber","year":"2007","journal-title":"IEEE Int Workshop on EMC of ICs (EMC Compo)"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2412014"},{"key":"ref13","first-page":"82","article-title":"Design and modelling of IC-Stripline having improved VSWR performance","author":"mandic","year":"2013","journal-title":"IEEE Int Workshop on EMC of ICs (EMC Compo)"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/EMCCompo.2013.6735175"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/EMCCompo.2015.7358347"},{"key":"ref16","first-page":"1","article-title":"Measuring and simulating EMI on very small components at high frequencies","author":"decrock","year":"2013","journal-title":"Proc IEEE Int Symp Electromagn Compat Eur (EMC Europe)"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/EMCEurope.2016.7739253"},{"key":"ref18","year":"2015","journal-title":"CST Microwave Studio User Manual"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.1980.1124303"},{"key":"ref4","year":"2012"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2172116"},{"key":"ref6","year":"2011"},{"key":"ref5","year":"2015"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2047970"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.814685"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2011.07.020"},{"key":"ref1","year":"2010"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2011.2118214"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1049\/el:19820186"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1002\/9781118894514"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/22.390179"},{"key":"ref23","first-page":"508","author":"gupta","year":"1996","journal-title":"Microstrip Lines and Slotlines"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8357403\/08293851.pdf?arnumber=8293851","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:12:29Z","timestamp":1642003949000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8293851\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,6]]},"references-count":23,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2018.2800238","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,6]]}}}