{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T16:31:21Z","timestamp":1777653081851,"version":"3.51.4"},"reference-count":18,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2018,9,1]],"date-time":"2018-09-01T00:00:00Z","timestamp":1535760000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2018,9,1]],"date-time":"2018-09-01T00:00:00Z","timestamp":1535760000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2018,9,1]],"date-time":"2018-09-01T00:00:00Z","timestamp":1535760000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2018,9]]},"DOI":"10.1109\/tim.2018.2811450","type":"journal-article","created":{"date-parts":[[2018,3,22]],"date-time":"2018-03-22T18:04:36Z","timestamp":1521741876000},"page":"2247-2255","source":"Crossref","is-referenced-by-count":15,"title":["A High-Efficiency Discrete Current Mode Output Stage Potentiostat Instrumentation for Self-Powered Electrochemical Devices"],"prefix":"10.1109","volume":"67","author":[{"given":"Sonia","family":"Ghanbari","sequence":"first","affiliation":[{"name":"Electrical Engineering Department, University of Isfahan, Isfahan, Iran"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4039-5030","authenticated-orcid":false,"given":"Mehdi","family":"Habibi","sequence":"additional","affiliation":[{"name":"Electrical Engineering Department, Sensors and Interfaces Research Group, University of Isfahan, Isfahan, Iran"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sebastian","family":"Magierowski","sequence":"additional","affiliation":[{"name":"Electrical Engineering Department, York University, Toronto, ON, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2013.2284179"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2016.2557787"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2015.2470111"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2007.893176"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2006.888777"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2170633"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1002\/cta.2240"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2007.893236"},{"key":"ref18","author":"weste","year":"2011","journal-title":"CMOS VLSI Design A Circuits and Systems Perspective"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JBHI.2015.2415836"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2015.04.063"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2479105"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2591948"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2008.2005927"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2013.04.049"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2663178"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2649998"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.electacta.2013.03.093"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8430491\/08322410.pdf?arnumber=8322410","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,29]],"date-time":"2025-03-29T03:19:32Z","timestamp":1743218372000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8322410\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,9]]},"references-count":18,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tim.2018.2811450","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,9]]}}}