{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,27]],"date-time":"2025-11-27T06:37:27Z","timestamp":1764225447181,"version":"3.37.3"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2018,12,1]],"date-time":"2018-12-01T00:00:00Z","timestamp":1543622400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2018,12]]},"DOI":"10.1109\/tim.2018.2830756","type":"journal-article","created":{"date-parts":[[2018,5,15]],"date-time":"2018-05-15T20:19:36Z","timestamp":1526415576000},"page":"2804-2811","source":"Crossref","is-referenced-by-count":21,"title":["Resolution-Based Analysis for Optimizing Subaperture Measurements in Circular SAR Imaging"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1644-0716","authenticated-orcid":false,"given":"Baolong","family":"Wu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6679-6900","authenticated-orcid":false,"given":"Yuan","family":"Gao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6003-5078","authenticated-orcid":false,"given":"Mohammad Tayeb","family":"Ghasr","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9421-1551","authenticated-orcid":false,"given":"Reza","family":"Zoughi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2620778"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1002\/9780470602492"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/22.79111"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.827093"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2013.2268245"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/36.789616"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2003.1188905"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2016.2582959"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"73090g","DOI":"10.1117\/12.817882","article-title":"Dual-surface dielectric depth detector for holographic millimeter-wave security scanners","volume":"7309","author":"mcmakin","year":"2009","journal-title":"Proc SPIE"},{"key":"ref19","first-page":"1","article-title":"Resolution analysis of circular SAR with partial circular aperture measurements","author":"kou","year":"2010","journal-title":"8th Eur Conf on Synthetic Aperture Radar (EUSAR)"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2169177"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/22.942570"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2022380"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2015.2453202"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2013.2287024"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2016.2630598"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/83.506760"},{"journal-title":"Synthetic Aperture Radar Signal Processing","year":"1999","author":"soumekh","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2015.2484260"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1049\/cp.2012.1605"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8528255\/08359450.pdf?arnumber=8359450","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T21:35:48Z","timestamp":1643232948000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8359450\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,12]]},"references-count":20,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tim.2018.2830756","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2018,12]]}}}