{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,11]],"date-time":"2026-02-11T20:55:00Z","timestamp":1770843300769,"version":"3.50.1"},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001475","name":"Nanyang Technological University","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001475","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Corp Lab@University Scheme"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2019,1]]},"DOI":"10.1109\/tim.2018.2838198","type":"journal-article","created":{"date-parts":[[2018,6,5]],"date-time":"2018-06-05T19:00:56Z","timestamp":1528225256000},"page":"169-176","source":"Crossref","is-referenced-by-count":34,"title":["Time-Variant In-Circuit Impedance Monitoring Based on the Inductive Coupling Method"],"prefix":"10.1109","volume":"68","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1501-4272","authenticated-orcid":false,"given":"Zhenyu","family":"Zhao","sequence":"first","affiliation":[]},{"given":"Kye-Yak","family":"See","sequence":"additional","affiliation":[]},{"given":"Eng-Kee","family":"Chua","sequence":"additional","affiliation":[]},{"given":"Arun Shankar","family":"Narayanan","sequence":"additional","affiliation":[]},{"given":"Wayne","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Arjuna","family":"Weerasinghe","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","author":"pozar","year":"2012","journal-title":"Microwave Engineering"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1137\/1.9781611971514"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-1371-4"},{"key":"ref13","first-page":"18","article-title":"Phase estimation of sinusoid signal based on DFT and error analysis","volume":"33","author":"zhan","year":"2007","journal-title":"J Beijing Univ Aeronautics Astronautics"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IPEC.2010.5543851"},{"key":"ref15","first-page":"2838","article-title":"Analysis of stray inductance’s influence on SiC MOSFET switching performance","author":"wang","year":"2014","journal-title":"Proc IEEE Energy Convers Congr Expo (ECCE)"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2195332"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2001.975958"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2001.931852"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1985.4315246"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LPEL.2004.834921"},{"key":"ref8","first-page":"1","article-title":"Early detection of induction motor’s defects using an inductively coupled impedance extraction method","author":"rathnayaka","year":"2017","journal-title":"Proc IEEE Int Electric Mach Drives Conf (IEMDC)"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"2489","DOI":"10.1109\/TIM.2015.2403091","article-title":"Inductive coupled in-circuit impedance monitoring of electrical system using two-port ABCD network approach","volume":"64","author":"li","year":"2015","journal-title":"IEEE Trans Instrum Meas"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2004.1296067"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1049\/ip-gtd:20030193"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2013.2292891"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8568022\/08372957.pdf?arnumber=8372957","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T20:52:12Z","timestamp":1657745532000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8372957\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,1]]},"references-count":16,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tim.2018.2838198","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,1]]}}}