{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,20]],"date-time":"2025-12-20T22:17:44Z","timestamp":1766269064883,"version":"3.37.3"},"reference-count":21,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"DST\/SERB","award":["YSS\/2015\/000029"],"award-info":[{"award-number":["YSS\/2015\/000029"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2019,1]]},"DOI":"10.1109\/tim.2018.2843078","type":"journal-article","created":{"date-parts":[[2018,6,19]],"date-time":"2018-06-19T18:37:33Z","timestamp":1529433453000},"page":"240-249","source":"Crossref","is-referenced-by-count":10,"title":["IR Transceiver Irradiation Characteristics on Bubble\/Slug Flow Regimes in Conventional and Minichannels"],"prefix":"10.1109","volume":"68","author":[{"given":"N.","family":"Mithran","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6513-7556","authenticated-orcid":false,"given":"Venkatesan","family":"Muniyandi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.809087"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijheatfluidflow.2009.02.019"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.expthermflusci.2016.11.027"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2015.07.006"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2183433"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2014.10.019"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/s17061278"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2013.03.001"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/13\/10\/305"},{"journal-title":"5mm infrared LED T-1 3\/4 IR333 Technical Data Sheet","year":"2005","key":"ref19"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s11814-014-0246-5"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.2478\/msr-2014-0002"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2013.02.049"},{"key":"ref5","first-page":"1539","article-title":"Void fraction measurement using electrical","volume":"7","author":"lawal","year":"2014","journal-title":"International Journal of Advanced Engineering Technology"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1115\/1.483269"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1021\/ie0490536"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/S1004-9541(06)60033-5"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.egypro.2012.02.190"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.apm.2011.09.069"},{"journal-title":"Everlight Technical Data Sheet 5mm Silicon PIN Photodiode T-l 3\/4","year":"2009","key":"ref20"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2017.09.008"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8568022\/08388208.pdf?arnumber=8388208","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T20:55:07Z","timestamp":1657745707000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8388208\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,1]]},"references-count":21,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tim.2018.2843078","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2019,1]]}}}