{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,30]],"date-time":"2026-05-30T02:41:46Z","timestamp":1780108906316,"version":"3.54.0"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.1109\/tim.2018.2855499","type":"journal-article","created":{"date-parts":[[2018,7,31]],"date-time":"2018-07-31T20:42:00Z","timestamp":1533069720000},"page":"854-863","source":"Crossref","is-referenced-by-count":13,"title":["Novel Broadband Calibration Method of Current Shunts Based on VNA"],"prefix":"10.1109","volume":"68","author":[{"given":"Mohamed","family":"Ouameur","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0996-9817","authenticated-orcid":false,"given":"Francois","family":"Ziade","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yann","family":"Le Bihan","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2004.305491"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/19.278637"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2012.6251014"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.908602"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2004.305307"},{"key":"ref15","first-page":"35","article-title":"Measurement method of AC current up to 1 MHz","author":"fortun\u00e9","year":"2014"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2219142"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/19.769617"},{"key":"ref18","year":"2017","journal-title":"Agilent Network Analyzer Basics"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/75.173410"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2004.305451"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.1990.109959"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2108553"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/49\/3\/349"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2010.5543247"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2242642"},{"key":"ref2","year":"2018","journal-title":"The BIPM Key Comparison Database"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2012.6250913"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.891117"},{"key":"ref20","author":"pozar","year":"2011","journal-title":"Microwave Engineering"},{"key":"ref22","year":"2008","journal-title":"Evaluation of Measurement Data—Supplement 1 to the ‘Guide to the Expression of Uncertainty in Measurement’—Propagation of Distributions Using a Monte Carlo Method"},{"key":"ref21","year":"2008","journal-title":"Evaluation of Measurement Data—Guide to the Expression of Uncertainty in Measurement"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/52\/1A\/01003"},{"key":"ref23","year":"2015","journal-title":"The BIPM Key Comparison Database Calibration and Measurement Capabilities Electricity and Magnetism"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8637784\/08423728.pdf?arnumber=8423728","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T20:57:50Z","timestamp":1657745870000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8423728\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":24,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tim.2018.2855499","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,3]]}}}