{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,15]],"date-time":"2026-04-15T17:55:15Z","timestamp":1776275715113,"version":"3.50.1"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51505404"],"award-info":[{"award-number":["51505404"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51675456"],"award-info":[{"award-number":["51675456"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Shanghai Pujiang Program of China","award":["16PJ1404300"],"award-info":[{"award-number":["16PJ1404300"]}]},{"DOI":"10.13039\/501100011290","name":"State Key Laboratory of Precision Measurement Technology and Instruments","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100011290","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2019,4]]},"DOI":"10.1109\/tim.2018.2858062","type":"journal-article","created":{"date-parts":[[2018,8,9]],"date-time":"2018-08-09T18:34:07Z","timestamp":1533839647000},"page":"1148-1156","source":"Crossref","is-referenced-by-count":37,"title":["Fast Defect Inspection Based on Data-Driven Photometric Stereo"],"prefix":"10.1109","volume":"68","author":[{"given":"Mingjun","family":"Ren","sequence":"first","affiliation":[]},{"given":"Xi","family":"Wang","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5494-722X","authenticated-orcid":false,"given":"Gaobo","family":"Xiao","sequence":"additional","affiliation":[]},{"given":"Minghan","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Lin","family":"Fu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2717284"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2013.196"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2005.158"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2010.5540084"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-33712-3_33"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1142\/S0129065704001899"},{"key":"ref36","author":"horn","year":"1986","journal-title":"Robot Vision"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.403"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/S0262-8856(98)00136-X"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2012.03.131"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2218677"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2017.2668395"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2712838"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2566442"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1117\/1.OE.52.3.039701"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1117\/12.7972479"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/DICTA.2013.6691532"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"1061","DOI":"10.5302\/J.ICROS.2013.13.9035","article-title":"Development of a reliable real-time 3D reconstruction system for tiny defects on steel surfaces","volume":"19","author":"yu","year":"2013","journal-title":"Journal of Institute Control Robotics and Systems"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2005.05.017"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2003.1238432"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2007.10.008"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/1201775.882343"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2017.07.010"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2017.07.009"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2013.196"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JLT.2016.2614542"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2017.09.005"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2012.05.009"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2028222"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2016.04.072"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1177\/0954405414522604"},{"key":"ref20","doi-asserted-by":"crossref","first-page":"95341d","DOI":"10.1117\/12.2182750","article-title":"Photometric stereo sensor for robot-assisted industrial quality inspection of coated composite material surfaces","volume":"9534","author":"weigl","year":"2015","journal-title":"Proc SPIE"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/s10851-016-0636-x"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1117\/1.1339200"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-009-0262-9"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICCVW.2017.66"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2012.6247691"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2014.280"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8663460\/08430598.pdf?arnumber=8430598","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T20:55:07Z","timestamp":1657745707000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8430598\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,4]]},"references-count":38,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tim.2018.2858062","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,4]]}}}