{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,11]],"date-time":"2025-12-11T20:50:34Z","timestamp":1765486234986,"version":"3.37.3"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2019,7]]},"DOI":"10.1109\/tim.2018.2866298","type":"journal-article","created":{"date-parts":[[2018,9,3]],"date-time":"2018-09-03T22:28:01Z","timestamp":1536013681000},"page":"2560-2569","source":"Crossref","is-referenced-by-count":10,"title":["Frequency Estimation Based on Moving-Window DFT With Fractional Bin-Index for Capacitance Measurement"],"prefix":"10.1109","volume":"68","author":[{"given":"Tushar","family":"Tyagi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9556-6431","authenticated-orcid":false,"given":"P.","family":"Sumathi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.908631"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2017100"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2336616"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2558140"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2004.1516381"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2459051"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2240092"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cds.2014.0248"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2555280"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2042420"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2014.2300057"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2048293"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2007.907854"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2005.850944"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2287801"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2735660"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2575338"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2159950"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2297295"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2498538"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2179342"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2015.2435256"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2161929"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1972.4313959"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2459473"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2004.826899"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2045933"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2206350"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2633524"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2596713"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2098352"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2028352"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2385658"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2585078"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8733158\/08453845.pdf?arnumber=8453845","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T21:02:16Z","timestamp":1657746136000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8453845\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,7]]},"references-count":34,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tim.2018.2866298","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2019,7]]}}}