{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:08:47Z","timestamp":1740132527551,"version":"3.37.3"},"reference-count":11,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Participating States through the EMPIR Programme"},{"name":"European Union\u2019s Horizon 2020 Research and Innovation Program"},{"name":"Dutch Ministry of Economic Affairs"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2019,6]]},"DOI":"10.1109\/tim.2018.2878090","type":"journal-article","created":{"date-parts":[[2018,11,13]],"date-time":"2018-11-13T19:36:41Z","timestamp":1542137801000},"page":"1653-1658","source":"Crossref","is-referenced-by-count":3,"title":["Compact Distributed Digitizers With Metrological Precision"],"prefix":"10.1109","volume":"68","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9430-618X","authenticated-orcid":false,"given":"Ernest","family":"Houtzager","sequence":"first","affiliation":[]},{"given":"R.","family":"Hornecker","sequence":"additional","affiliation":[]},{"given":"G.","family":"Rietveld","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"White Rabbit Users","year":"2018","key":"ref4"},{"key":"ref3","first-page":"1","article-title":"High-accuracy reference setup for system calibration of transformer loss measurement systems","author":"rietveld","year":"2017","journal-title":"20th Int'l Sympos High Voltage Eng (ISH)"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.890802"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1987.6312595"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.908602"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-50584-8"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/19.278628"},{"journal-title":"Torture Report","year":"2012","author":"lipinski","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2253975"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2014.6898540"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/19.769616"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8712472\/08533439.pdf?arnumber=8533439","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T20:53:44Z","timestamp":1657745624000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8533439\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6]]},"references-count":11,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2018.2878090","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2019,6]]}}}