{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T16:33:35Z","timestamp":1777653215893,"version":"3.51.4"},"reference-count":7,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"JSPS KAKENHI","award":["JP18H05258"],"award-info":[{"award-number":["JP18H05258"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2019,6]]},"DOI":"10.1109\/tim.2018.2879997","type":"journal-article","created":{"date-parts":[[2018,12,4]],"date-time":"2018-12-04T19:39:21Z","timestamp":1543952361000},"page":"2078-2083","source":"Crossref","is-referenced-by-count":5,"title":["Characterization of $1~\\mathrm{k}\\Omega$  Metal-Foil Standard Resistors and Continuing Drift-Rate Evaluation of 1$\\Omega$  and $10~\\Omega$  Standard Resistors"],"prefix":"10.1109","volume":"68","author":[{"given":"Takayuki","family":"Abe","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Takehiko","family":"Oe","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Masaya","family":"Kumagai","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Matsuo","family":"Zama","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3857-7940","authenticated-orcid":false,"given":"Nobu-Hisa","family":"Kaneko","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2398955"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2611318"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2253973"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1080\/19315775.2012.11721618"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2399013"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2108613"},{"key":"ref1","first-page":"1","article-title":"Characterization of \n$1~\\Omega$\n, \n$10~\\Omega$\n and 1 \n$\\text{k}\\Omega$\n metal-foil standard resistors","author":"abe","year":"2018","journal-title":"CPEM Dig"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8712472\/08558577.pdf?arnumber=8558577","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T21:08:40Z","timestamp":1657746520000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8558577\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6]]},"references-count":7,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2018.2879997","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,6]]}}}