{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T20:50:34Z","timestamp":1751403034233,"version":"3.37.3"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Braunschweig International Graduate School of Metrology"},{"name":"DFG Research Training Group GrK1952\u2013Metrology for Complex Nanosystems"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2019,6]]},"DOI":"10.1109\/tim.2018.2880052","type":"journal-article","created":{"date-parts":[[2018,12,12]],"date-time":"2018-12-12T19:59:13Z","timestamp":1544644753000},"page":"2295-2302","source":"Crossref","is-referenced-by-count":7,"title":["Asynchronous Optical Sampling for Laser-Based Vector Network Analysis on Coplanar Waveguides"],"prefix":"10.1109","volume":"68","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2766-298X","authenticated-orcid":false,"given":"Paul","family":"Struszewski","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5706-5417","authenticated-orcid":false,"given":"Mark","family":"Bieler","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1364\/OL.35.003799"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1088\/0957-0233\/26\/2\/025203"},{"key":"ref12","first-page":"1","article-title":"Time-domain waveform characterization of a 100 GHz ultrafast photodetector based on asynchronous electro-optic sampling","author":"gong","year":"2017","journal-title":"Proc URSI"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1364\/OL.30.001405"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1063\/1.2167812"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1364\/OE.18.005974"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1364\/OL.38.003322"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1038\/srep10786"},{"key":"ref18","first-page":"430","article-title":"High-resolution THz spectrometer with kHz scan rates","volume":"14","author":"bartels","year":"2006","journal-title":"Opt Lett"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1364\/OE.24.029930"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/TIM.2008.2009916"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/TMTT.2005.845760"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TIM.2016.2647519"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/TMTT.2015.2481426"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1366\/0003702874868025"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1007\/s10762-017-0433-7"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/CPEM.2004.305346"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1063\/1.2008379"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TMTT.2003.809186"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1364\/OE.18.001613"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1109\/CPEM.2018.8500830"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1364\/OL.35.003715"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1063\/1.2209718"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1364\/OE.23.027931"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1063\/1.2714048"},{"year":"2018","journal-title":"Asynchronous Optical Sampling System","key":"ref25"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8712472\/08574044.pdf?arnumber=8574044","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T20:54:59Z","timestamp":1657745699000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8574044\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6]]},"references-count":26,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2018.2880052","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2019,6]]}}}