{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,8]],"date-time":"2026-01-08T18:05:03Z","timestamp":1767895503614,"version":"3.49.0"},"reference-count":56,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Joint Research Project EXL04"},{"DOI":"10.13039\/501100001659","name":"Deutsche Forschungsgemeinschaft","doi-asserted-by":"publisher","award":["SPP1538"],"award-info":[{"award-number":["SPP1538"]}],"id":[{"id":"10.13039\/501100001659","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001659","name":"Deutsche Forschungsgemeinschaft","doi-asserted-by":"publisher","award":["KU 3271\/1-1"],"award-info":[{"award-number":["KU 3271\/1-1"]}],"id":[{"id":"10.13039\/501100001659","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001659","name":"Deutsche Forschungsgemeinschaft","doi-asserted-by":"publisher","award":["RE 1052\/24-2"],"award-info":[{"award-number":["RE 1052\/24-2"]}],"id":[{"id":"10.13039\/501100001659","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2019,6]]},"DOI":"10.1109\/tim.2018.2882930","type":"journal-article","created":{"date-parts":[[2018,12,18]],"date-time":"2018-12-18T19:32:31Z","timestamp":1545161551000},"page":"1765-1773","source":"Crossref","is-referenced-by-count":26,"title":["Spincaloritronic Measurements: A Round Robin Comparison of the Longitudinal Spin Seebeck Effect"],"prefix":"10.1109","volume":"68","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5362-8932","authenticated-orcid":false,"given":"Alessandro","family":"Sola","sequence":"first","affiliation":[]},{"given":"Vittorio","family":"Basso","sequence":"additional","affiliation":[]},{"given":"Michaela","family":"Kuepferling","sequence":"additional","affiliation":[]},{"given":"Massimo","family":"Pasquale","sequence":"additional","affiliation":[]},{"given":"Daniel Carsten","family":"ne Meier","sequence":"additional","affiliation":[]},{"given":"Gunter","family":"Reiss","sequence":"additional","affiliation":[]},{"given":"Timo","family":"Kuschel","sequence":"additional","affiliation":[]},{"given":"Takashi","family":"Kikkawa","sequence":"additional","affiliation":[]},{"given":"Ken-ichi","family":"Uchida","sequence":"additional","affiliation":[]},{"given":"Eiji","family":"Saitoh","sequence":"additional","affiliation":[]},{"given":"Hyungyu","family":"Jin","sequence":"additional","affiliation":[]},{"given":"Sarah J.","family":"Watzman","sequence":"additional","affiliation":[]},{"given":"Steve","family":"Boona","sequence":"additional","affiliation":[]},{"given":"Joseph","family":"Heremans","sequence":"additional","affiliation":[]},{"given":"Matthias B.","family":"Jungfleisch","sequence":"additional","affiliation":[]},{"given":"Wei","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"John E.","family":"Pearson","sequence":"additional","affiliation":[]},{"given":"Axel","family":"Hoffmann","sequence":"additional","affiliation":[]},{"given":"Hans W.","family":"Schumacher","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1063\/1.4950994"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.92.220407"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2016.2535167"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1038\/nmat3360"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2015.2449337"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2691762"},{"key":"ref37","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-662-04569-5","author":"nolas","year":"2001","journal-title":"Thermoelectrics Basic Principles and New Materials Developments"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevApplied.8.054038"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2015.2436362"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1088\/0953-8984\/26\/34\/343202"},{"key":"ref28","doi-asserted-by":"crossref","first-page":"4429","DOI":"10.1038\/srep04429","article-title":"Robust longitudinal spin-Seebeck effect in Bi-YIG thin films","volume":"4","author":"siegel","year":"2014","journal-title":"Sci Rep"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.87.104412"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1038\/srep23114"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1126\/science.1065389"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.37.5312"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.109.196602"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1063\/1.4754837"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1063\/1.2199473"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.115.096602"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.112.197201"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1063\/1.3533397"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2017.2703164"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1038\/srep46752"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevX.4.041023"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2018.8501206"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/aabfb3"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.115.037203"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1063\/1.4716012"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.95.174401"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.106.216601"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"1834","DOI":"10.1103\/PhysRevLett.83.1834","article-title":"Spin Hall effect","volume":"83","author":"hirsch","year":"1999","journal-title":"Phys Rev Lett"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.110.067207"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1126\/science.1105514"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1038\/nature07321"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1038\/nmat2856"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1038\/nmat2860"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.3507386"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.108.106602"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.87.054421"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.107.216604"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1038\/nmat2024"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1103\/RevModPhys.80.1517"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1038\/nphys3347"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/43\/26\/264002"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.107.066604"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.66.224403"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1063\/1.4916762"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.104.046601"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.119.227205"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.88.184425"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.97.020408"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms9211"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1038\/srep40586"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.92.224425"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.111.187201"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.88.214403"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8712472\/08580432.pdf?arnumber=8580432","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T21:08:40Z","timestamp":1657746520000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8580432\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6]]},"references-count":56,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2018.2882930","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,6]]}}}