{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T15:58:46Z","timestamp":1762012726539,"version":"build-2065373602"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"French National Metrology Network (RNMF) in the framework of project n\u00b0 157 in the field of electrical metrology"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2019,6]]},"DOI":"10.1109\/tim.2018.2884061","type":"journal-article","created":{"date-parts":[[2019,4,25]],"date-time":"2019-04-25T20:27:49Z","timestamp":1556224069000},"page":"2160-2167","source":"Crossref","is-referenced-by-count":7,"title":["On-Wafer Coplanar Waveguide Standards for S-Parameter Measurements of Balanced Circuits Up to 40 GHz"],"prefix":"10.1109","volume":"68","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2857-7584","authenticated-orcid":false,"given":"Thi Dao","family":"Pham","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Djamel","family":"Allal","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0996-9817","authenticated-orcid":false,"given":"Francois","family":"Ziade","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Eric","family":"Bergeault","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/TMTT.1970.1127226"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/TMTT.1987.1133637"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/ARFTG.1992.327008"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/ARFTGF.2004.1427590"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/ARFTG.1995.327126"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/22.85388"},{"key":"ref16","article-title":"Conception d’étalons coplanaires couplées pour la méthode d’étalonnage multimode TRL","author":"pham","year":"2017","journal-title":"Proc J Nationales Microondes"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1109\/CPEM.2018.8500997"},{"year":"2014","journal-title":"3D EM Simulation software","key":"ref18"},{"key":"ref19","article-title":"Coplanar structures","author":"wadell","year":"1991","journal-title":"Transmission Line Design Handbook"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/MWSYM.2007.380534"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/MMM.2008.919919"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TMTT.1979.1129778"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/22.668653"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/TMTT.2012.2193136"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/75.91092"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/TMTT.1982.1131118"},{"key":"ref9","first-page":"1","article-title":"A mixed-mode TRL algorithm based on symmetrical reflection standards","author":"liang","year":"2008","journal-title":"71st ARFTG Microw Meas Conf"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/22.392911"},{"key":"ref20","first-page":"299","article-title":"Analyse des coupleurs directifs coplanaires","volume":"39","author":"hanna","year":"1984","journal-title":"Ann Télécommun"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1109\/22.598443"},{"key":"ref21","article-title":"Modeling of multiconductor microstrip systems on microwave integrated circuits","author":"musa","year":"2013","journal-title":"Proc Comsol Conf"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1109\/75.173410"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1109\/ARFTGF.2004.1427588"},{"year":"2015","journal-title":"Keysight Technologies 85058B\/E 1 85 mm Calibration Kits","key":"ref26"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1109\/TMTT.1974.1128250"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8712472\/08699095.pdf?arnumber=8699095","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T21:08:40Z","timestamp":1657746520000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8699095\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6]]},"references-count":26,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2018.2884061","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2019,6]]}}}