{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,31]],"date-time":"2026-03-31T02:53:11Z","timestamp":1774925591153,"version":"3.50.1"},"reference-count":17,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"crossref","award":["2017YFF0206106"],"award-info":[{"award-number":["2017YFF0206106"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51777199"],"award-info":[{"award-number":["51777199"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2019,6]]},"DOI":"10.1109\/tim.2019.2890886","type":"journal-article","created":{"date-parts":[[2019,1,22]],"date-time":"2019-01-22T02:04:37Z","timestamp":1548122677000},"page":"1961-1966","source":"Crossref","is-referenced-by-count":11,"title":["Method for the Absolute Calibration of Direct-Current Current Transducers"],"prefix":"10.1109","volume":"68","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9198-461X","authenticated-orcid":false,"given":"Jianting","family":"Zhao","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0421-763X","authenticated-orcid":false,"given":"Yunfeng","family":"Lu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Changwei","family":"Zhai","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Qing","family":"He","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaoding","family":"Huang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2068-8706","authenticated-orcid":false,"given":"Yicheng","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2434096"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1049\/PBEL004E"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2265475"},{"key":"ref13","first-page":"603","article-title":"Calibration of DC current up to 600 A","author":"hong-gang","year":"2010","journal-title":"Proc Conf Precis Electromagn Meas (CPEM)"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2018.8500875"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IRE-I.1960.5006925"},{"key":"ref16","year":"2008"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1049\/ip-a-1.1982.0057"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1969.4325406"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.809914"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/31.99166"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1981.4331686"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCOME.1964.6539564"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/EE.1963.6540782"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/19.769628"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/21\/11\/112001"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2359812"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielaam\/19\/8712472\/8620271-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8712472\/08620271.pdf?arnumber=8620271","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T21:08:40Z","timestamp":1657746520000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8620271\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6]]},"references-count":17,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2019.2890886","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,6]]}}}