{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,13]],"date-time":"2026-01-13T15:51:01Z","timestamp":1768319461828,"version":"3.49.0"},"reference-count":19,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003706","name":"Korea Research Institute of Standards and Science","doi-asserted-by":"publisher","award":["KRISS-2018-GP2018-0001"],"award-info":[{"award-number":["KRISS-2018-GP2018-0001"]}],"id":[{"id":"10.13039\/501100003706","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Technology Development for Reliability Improvement of Clinical Data","award":["NRF-2018M3A9H6081482"],"award-info":[{"award-number":["NRF-2018M3A9H6081482"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2019,6]]},"DOI":"10.1109\/tim.2019.2896365","type":"journal-article","created":{"date-parts":[[2019,2,19]],"date-time":"2019-02-19T00:13:01Z","timestamp":1550535181000},"page":"1941-1947","source":"Crossref","is-referenced-by-count":8,"title":["Traceability Chain at KRISS from DC Quantum Hall Resistance to Farad Using Coaxial Bridges"],"prefix":"10.1109","volume":"68","author":[{"given":"Dan Bee","family":"Kim","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dewi M.","family":"Kassim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1588-8386","authenticated-orcid":false,"given":"Wan-Seop","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Luca","family":"Callegaro","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vincenzo","family":"D'Elia","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bruno","family":"Trinchera","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jan","family":"Kucera","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Radek","family":"Sedlacek","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/1681-7575\/aa5ba8"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/53\/4\/1045"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/piee.1963.0046"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2018.8501044"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2008.4574759"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/49\/1A\/01007"},{"key":"ref16","year":"0","journal-title":"CCEM-K7 Key Comparison on AC Voltage Ratio"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/19.192309"},{"key":"ref18","first-page":"366","article-title":"Recharacterization of the Zerodur capacitor by intercomparison of capacitance at KRISS, NML and VNIIM","author":"lee","year":"1996","journal-title":"Proc CPEM"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/46\/1A\/01003"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/40\/5\/009"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/19.571828"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/38\/4\/9"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/46\/6\/003"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3938\/jkps.58.1339"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.810454"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/22\/3\/021"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/4\/1\/002"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/47\/4\/013"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8712472\/08643335.pdf?arnumber=8643335","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T21:08:39Z","timestamp":1657746519000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8643335\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6]]},"references-count":19,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2019.2896365","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,6]]}}}