{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,4]],"date-time":"2026-06-04T21:16:34Z","timestamp":1780607794350,"version":"3.54.1"},"reference-count":19,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key R&D Program of China","award":["2016YFF0200100"],"award-info":[{"award-number":["2016YFF0200100"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61771441"],"award-info":[{"award-number":["61771441"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2019,6]]},"DOI":"10.1109\/tim.2019.2908693","type":"journal-article","created":{"date-parts":[[2019,4,4]],"date-time":"2019-04-04T18:55:03Z","timestamp":1554404103000},"page":"1990-1995","source":"Crossref","is-referenced-by-count":2,"title":["Behavior Modeling of the Amplifier Nonlinearity With the AC Josephson Voltage Standard"],"prefix":"10.1109","volume":"68","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0312-5127","authenticated-orcid":false,"given":"Kunli","family":"Zhou","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2026-9184","authenticated-orcid":false,"given":"Jifeng","family":"Qu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jianting","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xun","family":"Xu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yang","family":"Shi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2113830"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2007.898138"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/52\/5\/S242"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2012.6251040"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2018.8500939"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1088\/0953-2048\/17\/6\/014"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.908607"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/77.783736"},{"key":"ref18","year":"0","journal-title":"Datasheet of AD8597"},{"key":"ref19","author":"pedro","year":"2003","journal-title":"Intermodulation Distortion in Microwave and Wireless Circuits"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/INMMIC.2011.5773325"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2014.2365188"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2013.2249178"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2009.2019051"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1587\/transele.E94.C.273"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2014.2338326"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2003.822001"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1049\/el:19910226"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2014.2366916"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8712472\/08681726.pdf?arnumber=8681726","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T21:08:39Z","timestamp":1657746519000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8681726\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6]]},"references-count":19,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2019.2908693","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,6]]}}}