{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,6]],"date-time":"2026-07-06T09:35:49Z","timestamp":1783330549568,"version":"3.54.6"},"reference-count":55,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61601061"],"award-info":[{"award-number":["61601061"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61841103"],"award-info":[{"award-number":["61841103"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["81401490"],"award-info":[{"award-number":["81401490"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012166","name":"National Basic Research Program of China","doi-asserted-by":"publisher","award":["2018YFB1308200"],"award-info":[{"award-number":["2018YFB1308200"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100009377","name":"Education Department of Hunan Province","doi-asserted-by":"publisher","award":["17C0046"],"award-info":[{"award-number":["17C0046"]}],"id":[{"id":"10.13039\/100009377","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Hunan Key Laboratory of Intelligent Robot Technology in Electronic Manufacturing","award":["IRT2018009"],"award-info":[{"award-number":["IRT2018009"]}]},{"name":"Hunan Key Project of Research and Development Plan","award":["2018GK2022"],"award-info":[{"award-number":["2018GK2022"]}]},{"name":"Hunan Key Project of Research and Development Plan","award":["2018JJ3079"],"award-info":[{"award-number":["2018JJ3079"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2020,4]]},"DOI":"10.1109\/tim.2019.2909940","type":"journal-article","created":{"date-parts":[[2019,4,16]],"date-time":"2019-04-16T19:36:57Z","timestamp":1555443417000},"page":"1051-1065","source":"Crossref","is-referenced-by-count":82,"title":["DM-RIS: Deep Multimodel Rail Inspection System With Improved MRF-GMM and CNN"],"prefix":"10.1109","volume":"69","author":[{"given":"Xiating","family":"Jin","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0519-6458","authenticated-orcid":false,"given":"Yaonan","family":"Wang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1803-3148","authenticated-orcid":false,"given":"Hui","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5893-5026","authenticated-orcid":false,"given":"Hang","family":"Zhong","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Li","family":"Liu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5208-7975","authenticated-orcid":false,"given":"Q. M. Jonathan","family":"Wu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1131-2056","authenticated-orcid":false,"given":"Yimin","family":"Yang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"crossref","DOI":"10.1002\/0471721182","author":"mclachlan","year":"2000","journal-title":"Finite Mixture Models"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2803830"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2764844"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1111\/mice.12263"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2016.7533052"},{"key":"ref30","first-page":"668","article-title":"Convolutional neural networks for steel surface defect detection from photometric stereo images","author":"soukup","year":"2014","journal-title":"Proc Int Symp Vis Comput"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1002\/9781119229070"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1046\/j.1460-2695.2003.00693.x"},{"key":"ref35","first-page":"164","article-title":"Risk based ultrasonic rail test scheduling on Burlington Northern Santa Fe","volume":"119","author":"palese","year":"2001","journal-title":"Permanent Way Inst J Rep"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/WACV.2016.7477601"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2012.6252468"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2774242"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2871353"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.06.029"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2625815"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2014.06.012"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/INDIN.2016.7819194"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1108\/SR-03-2015-0039"},{"key":"ref24","first-page":"621","article-title":"Material classification and semantic segmentation of railway track images with deep convolutional neural networks","author":"gibert","year":"2015","journal-title":"Proc IEEE Int Conf Image Process (ICIP)"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2016.2568758"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2775345"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2016.7727522"},{"key":"ref50","doi-asserted-by":"crossref","first-page":"592","DOI":"10.1109\/76.718506","article-title":"A block-based MAP segmentation for image compressions","volume":"8","author":"won","year":"1998","journal-title":"IEEE Trans Circuits Syst Video Technol"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1016\/S0031-3203(02)00027-4"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.91"},{"key":"ref54","first-page":"1","volume":"20","author":"lafferty","year":"2001","journal-title":"Conditional Random Fields Probabilistic Models for Segmenting and Labeling Sequence Data"},{"key":"ref53","author":"badrinarayanan","year":"2015","journal-title":"Segnet A deep convolutional encoder-decoder architecture for robust semantic pixel-wise labelling"},{"key":"ref52","first-page":"3431","article-title":"Fully convolutional networks for semantic segmentation","author":"jonathan","year":"2015","journal-title":"Proc IEEE Conf Comput Vis Pattern Recognit"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2283741"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/83.701161"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2014.2388435"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2790498"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2016.2601065"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2016.2614809"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2013.2287155"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2012.2236555"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2014.6860871"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1177\/0954409711422189"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1784\/insi.2007.49.6.341"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2017.02.024"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2018.02.002"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2014.2307955"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1061\/JTEPBS.0000026"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s11042-016-4153-0"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2016.01.012"},{"key":"ref49","first-page":"391","article-title":"Edge boxes: Locating object proposals from edges","author":"zitnick","year":"2014","journal-title":"Proc Eur Conf Comput Vis"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2014.2342533"},{"key":"ref46","first-page":"91","article-title":"Faster R-CNN: Towards real-time object detection with region proposal networks","author":"ren","year":"2015","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/TCSVT.2012.2211176"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-013-0620-5"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.169"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1111\/j.2517-6161.1974.tb00999.x"},{"key":"ref41","author":"li","year":"2009","journal-title":"Markov Random Field Modeling in Image Analysis"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TNN.2004.841773"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2007.891771"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9031568\/08692707.pdf?arnumber=8692707","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T14:19:53Z","timestamp":1651069193000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8692707\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,4]]},"references-count":55,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tim.2019.2909940","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,4]]}}}