{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,29]],"date-time":"2026-05-29T19:47:07Z","timestamp":1780084027638,"version":"3.54.0"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100002923","name":"National Scientific and Technical Research Council","doi-asserted-by":"crossref","award":["PIP-0558"],"award-info":[{"award-number":["PIP-0558"]}],"id":[{"id":"10.13039\/501100002923","id-type":"DOI","asserted-by":"crossref"}]},{"name":"La Plata National University","award":["I-219"],"award-info":[{"award-number":["I-219"]}]},{"name":"National Agency for Scientific and Technological Promotion","award":["PICT-2015\/2257"],"award-info":[{"award-number":["PICT-2015\/2257"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2020,6]]},"DOI":"10.1109\/tim.2019.2926877","type":"journal-article","created":{"date-parts":[[2019,7,7]],"date-time":"2019-07-07T18:51:14Z","timestamp":1562525474000},"page":"2790-2797","source":"Crossref","is-referenced-by-count":61,"title":["A Noncontact Voltage Measurement System for Power-Line Voltage Waveforms"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1387-3436","authenticated-orcid":false,"given":"Marcelo A.","family":"Haberman","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Enrique M.","family":"Spinelli","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/PTC.2011.6019197"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2030928"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2809079"},{"key":"ref13","first-page":"1","article-title":"A non-contact voltage measurement system","author":"shenil","year":"2018","journal-title":"Proc IEEE Int Instrum Meas Technol Conf (I2MTC)"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2619666"},{"key":"ref15","article-title":"Ultra-low power sensor for autonomous non-invasive voltage measurement in IoT solutions for energy efficiency","volume":"9517","author":"villani","year":"2015","journal-title":"Proc SPIE"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2014.2359619"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2015.7151301"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2013.6688560"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2696485"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2459531"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2519392"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/31\/10\/S03"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/RBME.2010.2084078"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2636862"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2017.1849"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.medengphy.2015.12.006"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2360804"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/bios7010002"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2017.8006388"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/0141-5425(86)90026-9"},{"key":"ref21","year":"2019","journal-title":"Fluke T6 Electrical Testers With Fieldsense Technology"},{"key":"ref24","author":"bhat","year":"2012","journal-title":"Stabilize Your Transimpedance Amplifier MaximIntegrated"},{"key":"ref23","article-title":"Compensate transimpedance amplifiers intuitively","author":"wang","year":"1993"},{"key":"ref25","year":"2011","journal-title":"Industrial 14kSPS 24-Bit Analog-to-Digital Converter with Low-Drift Reference"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9091650\/08755857.pdf?arnumber=8755857","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T14:46:37Z","timestamp":1651070797000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8755857\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,6]]},"references-count":25,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2019.2926877","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,6]]}}}