{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:09:22Z","timestamp":1740132562534,"version":"3.37.3"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001691","name":"Japan Society for the Promotion of Science (JSPS) KAKENHI","doi-asserted-by":"publisher","award":["17K05113"],"award-info":[{"award-number":["17K05113"]}],"id":[{"id":"10.13039\/501100001691","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2020,6]]},"DOI":"10.1109\/tim.2019.2937424","type":"journal-article","created":{"date-parts":[[2019,8,27]],"date-time":"2019-08-27T20:05:12Z","timestamp":1566936312000},"page":"3698-3703","source":"Crossref","is-referenced-by-count":2,"title":["Measurement of the Melting Point of Gallium Using a Johnson Noise Thermometer"],"prefix":"10.1109","volume":"69","author":[{"given":"Chiharu","family":"Urano","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kazuaki","family":"Yamazawa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nobu-Hisa","family":"Kaneko","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s10765-011-0922-1"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1098\/rsta.2015.0048"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/43\/3\/009"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.843574"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s10765-007-0196-9"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s10765-007-0249-0"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s10765-010-0830-9"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1063\/1.4819514"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2018.8501236"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1088\/1681-7575\/aa950a"},{"key":"ref4","first-page":"37","article-title":"A new approach to Johnson noise thermometry using a Josephson quantized voltage source for calibration","author":"benz","year":"2002","journal-title":"Proc Tempmeko"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRev.32.110"},{"key":"ref6","first-page":"67","article-title":"New quantum voltage noise source for Johnson noise thermometry","author":"maezawa","year":"2012","journal-title":"Proc 5th Supercond SFQ VLSI Workshop"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/1681-7575\/aa781e"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/1681-7575\/aa7cdd"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1063\/1.4940926"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRev.32.97"},{"journal-title":"Information for users about the proposed revision of the SI","year":"2019","key":"ref1"},{"journal-title":"Estimates of the Differences Between Thermodynamic Temperature and the ITS-90","year":"2019","key":"ref9"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1088\/1681-7575\/aa99bc"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9091648\/08816694.pdf?arnumber=8816694","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T14:42:13Z","timestamp":1651070533000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8816694\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,6]]},"references-count":20,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2019.2937424","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2020,6]]}}}