{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,10]],"date-time":"2026-03-10T18:24:02Z","timestamp":1773167042939,"version":"3.50.1"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2020,7,1]],"date-time":"2020-07-01T00:00:00Z","timestamp":1593561600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,7,1]],"date-time":"2020-07-01T00:00:00Z","timestamp":1593561600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,7,1]],"date-time":"2020-07-01T00:00:00Z","timestamp":1593561600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Science Foundation of China","doi-asserted-by":"publisher","award":["61774126"],"award-info":[{"award-number":["61774126"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100008982","name":"National Science Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100008982","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000028","name":"Semiconductor Research Corporation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000028","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100004361","name":"Texas Instruments Inc","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100004361","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2020,7]]},"DOI":"10.1109\/tim.2019.2942474","type":"journal-article","created":{"date-parts":[[2019,10,2]],"date-time":"2019-10-02T19:38:01Z","timestamp":1570045081000},"page":"4578-4591","source":"Crossref","is-referenced-by-count":8,"title":["MIRE: A Multitone Identification and Replacement Method for Multitone Spectral Test Without Requiring Coherent Sampling"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2918-5785","authenticated-orcid":false,"given":"Minshun","family":"Wu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cheng","family":"Ban","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiangtao","family":"Xu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4002-9281","authenticated-orcid":false,"given":"Li","family":"Geng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5938-6329","authenticated-orcid":false,"given":"Degang","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511807213"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/19.982947"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/19.492793"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2010.5488200"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.01.058"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2047298"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2243500"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/19.893254"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2401211"},{"key":"ref18","first-page":"1398","article-title":"A computationally efficient method for accurate spectral testing without requiring coherent sampling","author":"yu","year":"2004","journal-title":"Proc IEEE Int Conf Test"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/NAECON.2010.5712927"},{"key":"ref28","year":"2017","journal-title":"Data Sheet of AD7989-1\/AD7989-5"},{"key":"ref4","year":"2011"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2017.2740937"},{"key":"ref3","year":"2011"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2006.328340"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1979.4314779"},{"key":"ref5","author":"kester","year":"2004","journal-title":"Analog-Digital Conversion"},{"key":"ref8","author":"burns","year":"2012","journal-title":"An Introduction to Mixed-Signal IC Test and Measurement"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2267473"},{"key":"ref2","year":"2008"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1978.10837"},{"key":"ref1","author":"razavi","year":"1998","journal-title":"RF Microelectronics"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2011.5944273"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651920"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2180971"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2709467"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2014.2348315"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1587\/elex.13.20160784"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139176"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9112796\/08855012.pdf?arnumber=8855012","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T14:40:23Z","timestamp":1651070423000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8855012\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,7]]},"references-count":30,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tim.2019.2942474","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,7]]}}}