{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,27]],"date-time":"2026-05-27T18:09:53Z","timestamp":1779905393582,"version":"3.53.1"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2020,7,1]],"date-time":"2020-07-01T00:00:00Z","timestamp":1593561600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/100014132","name":"European Metrology Programme for Innovation and Research (EMPIR) Project","doi-asserted-by":"publisher","award":["18SIB09"],"award-info":[{"award-number":["18SIB09"]}],"id":[{"id":"10.13039\/100014132","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Traceability for electrical measurements at millimetre-wave and terahertz frequencies for communications and electronics technologies"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2020,7]]},"DOI":"10.1109\/tim.2019.2954010","type":"journal-article","created":{"date-parts":[[2019,11,20]],"date-time":"2019-11-20T20:46:18Z","timestamp":1574282778000},"page":"4930-4939","source":"Crossref","is-referenced-by-count":46,"title":["Characterization of Dielectric Materials at WR-15 Band (50\u201375 GHz) Using VNA-Based Technique"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0364-2143","authenticated-orcid":false,"given":"Yi","family":"Wang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0298-4184","authenticated-orcid":false,"given":"Xiaobang","family":"Shang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1462-2914","authenticated-orcid":false,"given":"Nick M.","family":"Ridler","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4120-2800","authenticated-orcid":false,"given":"Tongde","family":"Huang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6942-0589","authenticated-orcid":false,"given":"Wen","family":"Wu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref38","doi-asserted-by":"crossref","first-page":"191s","DOI":"10.1088\/0026-1394\/51\/4\/S191","article-title":"Evaluating and expressing uncertainty in high-frequency electromagnetic measurements: A selective review","volume":"51","author":"ridler","year":"2014","journal-title":"Metrologia"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2003.809693"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.4071\/1551-4897-5.1.1"},{"key":"ref31","first-page":"187","article-title":"A quasi-optical free-space method for dielectric constant characterization of polymer materials in mm-wave band","author":"elhawil","year":"2007","journal-title":"Proc Symp IEEE\/LEOS Benelux Chapter"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2019.2920532"},{"key":"ref37","doi-asserted-by":"crossref","first-page":"295","DOI":"10.1088\/0026-1394\/39\/3\/6","article-title":"An approach to the treatment of uncertainty in complex S-parameter measurements","volume":"39","author":"ridler","year":"2002","journal-title":"Metrologia"},{"key":"ref36","volume":"120","author":"ridler","year":"1992","journal-title":"An Uncertainty Budget for VHF and UHF Reflectometers"},{"key":"ref35","first-page":"1","article-title":"News in RF impedance measurements","author":"ridler","year":"2002","journal-title":"Proc General Assembly of the International Union of Radio Science (URSI)"},{"key":"ref34","year":"2008","journal-title":"Evaluation of Measurement Data—Guide to the Expression of Uncertainty in Measurement"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2015.2394740"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2805962"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s10762-016-0341-2"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3390\/diagnostics8020040"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TTHZ.2014.2362013"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2007.898835"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2016.2644108"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s10762-017-0410-1"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/UCMMT.2016.7873952"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.23919\/APMC.2018.8617486"},{"key":"ref28","article-title":"Dielectric anisotropy of modern microwave substrates","author":"dankov","year":"2010","journal-title":"Microwave and Millimeter Wave Technologies from Photonic Bandgap Devices to Antenna and Applications"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2005.1561795"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ECTC.2019.00115"},{"key":"ref3","article-title":"A guide to the characterisation of dielectric materials at RF and microwave frequencies","author":"clarke","year":"2003"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2016.2519027"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1002\/mop.26812"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2017.2772187"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2018.2864876"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2005.848094"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2376115"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s10762-016-0256-y"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2016.2587745"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/APS.2010.5562170"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1049\/ip-h-1.1984.0053"},{"key":"ref21","article-title":"MCK User Guide—Version 1.1","author":"dimitriades","year":"2018"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/22.57336"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2005.1604138"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/APMC.2017.8251534"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.jallcom.2008.10.092"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9112789\/08907463.pdf?arnumber=8907463","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,17]],"date-time":"2021-12-17T20:01:13Z","timestamp":1639771273000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8907463\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,7]]},"references-count":38,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tim.2019.2954010","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,7]]}}}