{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T00:15:17Z","timestamp":1771978517159,"version":"3.50.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2020,7,1]],"date-time":"2020-07-01T00:00:00Z","timestamp":1593561600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,7,1]],"date-time":"2020-07-01T00:00:00Z","timestamp":1593561600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,7,1]],"date-time":"2020-07-01T00:00:00Z","timestamp":1593561600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2020,7]]},"DOI":"10.1109\/tim.2019.2957867","type":"journal-article","created":{"date-parts":[[2019,12,5]],"date-time":"2019-12-05T20:55:25Z","timestamp":1575579325000},"page":"5100-5106","source":"Crossref","is-referenced-by-count":11,"title":["Noise in an FM-Converted Self-Mixing Interferometer"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8571-1527","authenticated-orcid":false,"given":"Michele","family":"Norgia","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1747-7193","authenticated-orcid":false,"given":"Victor","family":"Contreras","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2977-0194","authenticated-orcid":false,"given":"Silvano","family":"Donati","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/68.867997"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/LPT.2004.824631"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1364\/OL.40.002814"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/LPT.2017.2735899"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JQE.2017.2744984"},{"key":"ref15","author":"donati","year":"2004","journal-title":"Electro-Optical Instrumentation Sensing and Measuring with Lasers"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1002\/9780470409718"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/3.29238"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JLT.1986.1074666"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSTQE.2012.2234445"},{"key":"ref28","author":"ohtsubo","year":"2008","journal-title":"Semiconductor Lasers Stability Instability and Chaos"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1364\/AO.45.007264"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1002\/0470856211.ch7"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1364\/AOP.7.000570"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JQE.2015.2497237"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevA.52.R3436"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2006.876544"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1117\/1.OE.57.5.051506"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/19.746605"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/lpor.201100002"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSTQE.2013.2270279"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/T-AIEE.1947.5059584"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/2944.401232"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JQE.2012.2211862"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/68.87893"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JQE.1984.1072420"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.pquantelec.2012.06.001"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1364\/OE.19.009582"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1364\/OL.12.000800"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9112789\/08924652.pdf?arnumber=8924652","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T14:38:01Z","timestamp":1651070281000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8924652\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,7]]},"references-count":29,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tim.2019.2957867","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,7]]}}}