{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,14]],"date-time":"2026-04-14T14:44:17Z","timestamp":1776177857047,"version":"3.50.1"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T00:00:00Z","timestamp":1596240000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T00:00:00Z","timestamp":1596240000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T00:00:00Z","timestamp":1596240000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100013076","name":"National Major Science and Technology Projects of China","doi-asserted-by":"publisher","award":["2017ZX04011014"],"award-info":[{"award-number":["2017ZX04011014"]}],"id":[{"id":"10.13039\/501100013076","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2020,8]]},"DOI":"10.1109\/tim.2019.2958470","type":"journal-article","created":{"date-parts":[[2019,12,9]],"date-time":"2019-12-09T20:18:02Z","timestamp":1575922682000},"page":"5546-5555","source":"Crossref","is-referenced-by-count":42,"title":["An Effective Chatter Detection Method in Milling Process Using Morphological Empirical Wavelet Transform"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8440-8545","authenticated-orcid":false,"given":"Qi","family":"Zhang","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7190-2429","authenticated-orcid":false,"given":"Xiaotong","family":"Tu","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5365-2593","authenticated-orcid":false,"given":"Fucai","family":"Li","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8090-9112","authenticated-orcid":false,"given":"Yue","family":"Hu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ICIEA.2018.8398179"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.11.046"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmachtools.2016.06.002"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2013.2265222"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.1979.4310076"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2016.09.012"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2421711"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmachtools.2012.06.007"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-017-0024-8"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"651","DOI":"10.1016\/j.ijmachtools.2010.03.012","article-title":"Using detrended fluctuation analysis to monitor chattering in cutter tool machines","volume":"50","author":"jauregui-correa","year":"2010","journal-title":"Int J Mach Tools Manuf"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2013.05.001"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s11431-011-4595-6"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TMEE.2011.6199646"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-016-9660-7"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1115\/1.4026948"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"114","DOI":"10.1016\/j.apacoust.2012.12.004","article-title":"Chatter detection in band sawing based on discriminant analysis of sound features","volume":"77","author":"poto?nik","year":"2014","journal-title":"Appl Acoust"},{"key":"ref19","first-page":"109","volume":"58","author":"tansel","year":"2012","journal-title":"Detecting chatter and estimating wear from the torque of end milling signals by using Index Based Reasoner (IBR)"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2015.03.030"},{"key":"ref4","first-page":"707","volume":"72","author":"wang","year":"2014","journal-title":"Prediction of regenerative chatter in the high-speed vertical milling of thin-walled workpiece made of titanium alloy"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmachtools.2015.03.002"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2017.02.035"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.apm.2014.06.010"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.procir.2013.09.018"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmecsci.2015.05.013"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmachtools.2012.05.007"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2010.05.010"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmachtools.2011.01.001"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"1397","DOI":"10.1016\/S0890-6955(03)00184-6","article-title":"Automatic chatter detection in grinding","volume":"43","author":"baus","year":"2003","journal-title":"Int J Mach Tools Manuf"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirpj.2008.06.003"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmachtools.2006.01.021"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2015.09.046"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2005.11.002"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmachtools.2004.02.020"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1155\/2016\/3196465"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/s11831-014-9135-7"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2009.01.003"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9123773\/08930060.pdf?arnumber=8930060","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T14:33:56Z","timestamp":1651070036000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8930060\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,8]]},"references-count":36,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tim.2019.2958470","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,8]]}}}