{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,20]],"date-time":"2025-12-20T22:10:33Z","timestamp":1766268633387},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2020]]},"DOI":"10.1109\/tim.2020.2991601","type":"journal-article","created":{"date-parts":[[2020,4,30]],"date-time":"2020-04-30T19:46:22Z","timestamp":1588275982000},"page":"1-1","source":"Crossref","is-referenced-by-count":18,"title":["Precision Adjustment of Probe Tilt Angle with RF Signal Detection Technique"],"prefix":"10.1109","author":[{"given":"Ryo","family":"Sakamaki","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Masahiro","family":"Horibe","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.2017.8255866"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/22.85388"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/BCTM.2011.6082782"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.2001.327488"},{"key":"ref12","first-page":"1","article-title":"Monte-Carlo analysis of measurement uncertainties for on-wafer thru-reflect-line calibrations","author":"leinhos","year":"2008","journal-title":"71st ARFTG Microw Meas Conf"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.2017.8255871"},{"key":"ref14","author":"arz","year":"2018","journal-title":"Best Practice Guide for Planar S-Parameter Measurements using Vector Network Analysers"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.2017.8255867"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2018.2832067"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2806058"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1587\/elex.16.20181081"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.7567\/JJAP.57.11UE01"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.2016.7501967"},{"key":"ref4","first-page":"1","article-title":"On-wafer s-parameter de-embedding of silicon active and passive devices up to 170 GHz","author":"yau","year":"2010","journal-title":"IEEE MTT-S Int Microw Symp Dig"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2909490"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2018.8500810"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2005.848777"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/22.76439"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2008.4585991"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2014.2356176"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.2015.7162905"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MVT.2019.2921162"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MCOM.2011.5783993"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2014.6848606"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.7567\/1347-4065\/ab36f6"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2018.8500884"},{"key":"ref21","author":"doan","year":"2018","journal-title":"Introduction to on-Wafer Characterization at Microwave Frequencies"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2019.2908857"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2907733"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2018.8439837"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.2015.7381476"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/4407674\/09082641.pdf?arnumber=9082641","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T14:46:38Z","timestamp":1651070798000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9082641\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/tim.2020.2991601","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020]]}}}