{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,10]],"date-time":"2026-03-10T01:07:38Z","timestamp":1773104858650,"version":"3.50.1"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U1632274"],"award-info":[{"award-number":["U1632274"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61601386"],"award-info":[{"award-number":["61601386"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["11761141010"],"award-info":[{"award-number":["11761141010"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/tim.2020.3016069","type":"journal-article","created":{"date-parts":[[2020,8,14]],"date-time":"2020-08-14T20:08:27Z","timestamp":1597435707000},"page":"1-9","source":"Crossref","is-referenced-by-count":7,"title":["Periodic Artifact Suppression for Pure Shift NMR Spectroscopy"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4787-2386","authenticated-orcid":false,"given":"Hong","family":"Li","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5514-455X","authenticated-orcid":false,"given":"Yu","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8202-5639","authenticated-orcid":false,"given":"Haolin","family":"Zhan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0915-341X","authenticated-orcid":false,"given":"Xiaoqing","family":"Lin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1473-2224","authenticated-orcid":false,"given":"Zhong","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1002\/9780470034590.emrstm1362"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1002\/mrc.4238"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.pnmrs.2015.02.002"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1002\/chem.201800524"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1002\/anie.201609676"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1002\/anie.201001107"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmr.2012.02.018"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmr.2018.05.012"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmr.2015.08.011"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1039\/C7CC04423B"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2897036"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2894047"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/0009-2614(82)83229-6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2018.2875797"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1002\/chem.201303235"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1006\/jmre.1996.1063"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/anie.201701097"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-017-02592-z"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/anie.201404111"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1021\/acs.analchem.7b02740"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2794478"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1002\/anie.201409291"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1561\/2200000016"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2014.366"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9259274\/09167269.pdf?arnumber=9167269","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:52:19Z","timestamp":1652194339000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9167269\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/tim.2020.3016069","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021]]}}}