{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,31]],"date-time":"2025-12-31T14:55:17Z","timestamp":1767192917628,"version":"3.37.3"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100008982","name":"NPRP through the Qatar National Research Fund","doi-asserted-by":"publisher","award":["10-0101-170085"],"award-info":[{"award-number":["10-0101-170085"]}],"id":[{"id":"10.13039\/100008982","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/tim.2020.3027925","type":"journal-article","created":{"date-parts":[[2020,9,30]],"date-time":"2020-09-30T20:09:40Z","timestamp":1601496580000},"page":"1-11","source":"Crossref","is-referenced-by-count":27,"title":["Characterization of Defects Inside the Cable Dielectric With Partial Discharge Modeling"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1894-8994","authenticated-orcid":false,"given":"Qasim","family":"Khan","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9392-6141","authenticated-orcid":false,"given":"Shady S.","family":"Refaat","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8687-3942","authenticated-orcid":false,"given":"Haitham","family":"Abu-Rub","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0730-0677","authenticated-orcid":false,"given":"Hamid A.","family":"Toliyat","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4022-6082","authenticated-orcid":false,"given":"Marek","family":"Olesz","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5900-4821","authenticated-orcid":false,"given":"Ahmad","family":"Darwish","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2014.004150"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2921089"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2019.8726048"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/EIC.2013.6554201"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/23\/12\/012"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2016.006045"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2005.1522184"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2016.005971"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2008.4712652"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/94.407017"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ELINSL.2008.4570270"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICEEOT.2016.7754993"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/490\/1\/012209"},{"journal-title":"High Voltage Test Techniques–Partial Discharge Measurements","year":"2000","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2018.006837"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2005.1522185"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2013.6507409"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/EIC.2011.5996122"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2019.8735667"},{"article-title":"Modelling of cavity partial discharges at variable applied frequency","year":"2008","author":"forss\u00e9n","key":"ref20"},{"article-title":"Modelling partial discharge in gaseous voids","year":"2018","author":"callender","key":"ref22"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/aaae7c"},{"key":"ref23","doi-asserted-by":"crossref","first-page":"612","DOI":"10.1109\/TDEI.2013.6508765","article-title":"Dynamic behavior of surface charge distribution during partial discharge sequences","volume":"20","author":"wu","year":"2013","journal-title":"IEEE Trans Dielectrics Electr Insul"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9259274\/09210022.pdf?arnumber=9210022","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:51:25Z","timestamp":1652194285000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9210022\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/tim.2020.3027925","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2021]]}}}