{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,25]],"date-time":"2026-06-25T17:32:10Z","timestamp":1782408730566,"version":"3.54.5"},"reference-count":137,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2020,12,1]],"date-time":"2020-12-01T00:00:00Z","timestamp":1606780800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,12,1]],"date-time":"2020-12-01T00:00:00Z","timestamp":1606780800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,12,1]],"date-time":"2020-12-01T00:00:00Z","timestamp":1606780800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61988101"],"award-info":[{"award-number":["61988101"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61973323"],"award-info":[{"award-number":["61973323"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51704089"],"award-info":[{"award-number":["51704089"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Hunan Provincial National Science Foundation of China","award":["2020JJ4747"],"award-info":[{"award-number":["2020JJ4747"]}]},{"DOI":"10.13039\/501100010867","name":"Innovation and Development Project of Ministry of Industry and Information Technology of the People\u2019s Republic of China","doi-asserted-by":"publisher","award":["TC19084DY"],"award-info":[{"award-number":["TC19084DY"]}],"id":[{"id":"10.13039\/501100010867","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2020,12]]},"DOI":"10.1109\/tim.2020.3030167","type":"journal-article","created":{"date-parts":[[2020,10,12]],"date-time":"2020-10-12T19:28:55Z","timestamp":1602530935000},"page":"9329-9349","source":"Crossref","is-referenced-by-count":132,"title":["Automated Visual Defect Classification for Flat Steel Surface: A Survey"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2822-5538","authenticated-orcid":false,"given":"Qiwu","family":"Luo","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5323-057X","authenticated-orcid":false,"given":"Xiaoxin","family":"Fang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2115-0978","authenticated-orcid":false,"given":"Jiaojiao","family":"Su","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9331-2502","authenticated-orcid":false,"given":"Jian","family":"Zhou","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6184-0626","authenticated-orcid":false,"given":"Bingxing","family":"Zhou","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2550-1509","authenticated-orcid":false,"given":"Chunhua","family":"Yang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2011-2873","authenticated-orcid":false,"given":"Li","family":"Liu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5337-6445","authenticated-orcid":false,"given":"Weihua","family":"Gui","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3869-2415","authenticated-orcid":false,"given":"Lu","family":"Tian","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1002\/srin.201600049"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2184959"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2012.03.007"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/S0963-8695(03)00081-1"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.3390\/s20051459"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.3390\/app8112195"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/S0924-0136(02)00294-7"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2018.01.010"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2712838"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.2355\/isijinternational.54.1638"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2014.10.006"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.11113\/jt.v77.6562"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1186\/1687-5281-2014-50"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1006\/cviu.1995.1017"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/s11831-016-9194-z"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.5565\/rev\/elcvia.268"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.1930.896476"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2015.01.008"},{"key":"ref101","doi-asserted-by":"publisher","DOI":"10.1016\/j.imavis.2015.01.001"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijleo.2016.09.110"},{"key":"ref100","doi-asserted-by":"publisher","DOI":"10.1007\/s12613-013-0690-y"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.imavis.2011.02.002"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2010.5675519"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1007\/s11042-017-5238-0"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2010.11.030"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/83.336245"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/AMM.433-435.383"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2006.885448"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/24\/2\/025401"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2017.11.018"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-25658-5_21"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/DBTA.2009.133"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2018.03.014"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2218677"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.2355\/isijinternational.54.2598"},{"key":"ref6","first-page":"3049","article-title":"Automatic recognition of surface defects on hot-rolled steel strip using scattering convolution network","volume":"10","author":"song","year":"2014","journal-title":"J Comput Inf Syst"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2015.09.008"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-019-01247-4"},{"key":"ref49","first-page":"1667","article-title":"A computer vision system for automatic steel surface inspection","author":"liu","year":"2010","journal-title":"Proc IEEE Ind Electron Appl Conf"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-016-9489-0"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2019.04.006"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/JSTSP.2012.2212416"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2019.03.010"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1007\/s10921-016-0370-8"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.2355\/isijinternational.54.112"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1364\/AO.55.000047"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.2355\/isijinternational.ISIJINT-2015-053"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1063\/1.4901222"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1016\/j.optcom.2016.10.062"},{"key":"ref127","first-page":"5034","article-title":"Surface defects inspection of cold rolled strips based on neural network","author":"kang","year":"2005","journal-title":"Proc Int Conf Mach Learn Cybern"},{"key":"ref126","doi-asserted-by":"publisher","DOI":"10.1155\/2018\/9298017"},{"key":"ref125","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2016.07.001"},{"key":"ref124","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-017-1113-4"},{"key":"ref73","doi-asserted-by":"publisher","DOI":"10.5937\/fmet1904765K"},{"key":"ref72","doi-asserted-by":"publisher","DOI":"10.1109\/FUZZY.2010.5584036"},{"key":"ref129","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7299066"},{"key":"ref71","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.1983.4767445"},{"key":"ref128","doi-asserted-by":"publisher","DOI":"10.1371\/journal.pone.0092137"},{"key":"ref70","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2015.2417676"},{"key":"ref76","doi-asserted-by":"publisher","DOI":"10.3390\/app9204222"},{"key":"ref130","doi-asserted-by":"publisher","DOI":"10.1007\/s13369-017-2825-3"},{"key":"ref77","doi-asserted-by":"publisher","DOI":"10.1007\/s11042-012-1248-0"},{"key":"ref74","doi-asserted-by":"publisher","DOI":"10.1016\/S0963-8695(96)00045-X"},{"key":"ref75","doi-asserted-by":"publisher","DOI":"10.1016\/j.jvcir.2015.04.005"},{"key":"ref133","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2020.2967415"},{"key":"ref134","article-title":"Semi-supervised learning with generative adversarial networks","author":"odena","year":"2016","journal-title":"arXiv 1606 01583"},{"key":"ref131","first-page":"2672","article-title":"Generative adversarial nets","author":"goodfellow","year":"2014","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref78","doi-asserted-by":"publisher","DOI":"10.1049\/iet-ipr:20060113"},{"key":"ref132","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2945403"},{"key":"ref79","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmachtools.2005.03.013"},{"key":"ref136","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2020.03.009"},{"key":"ref135","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2019.06.020"},{"key":"ref137","first-page":"1","article-title":"MixMatch: A holistic approach to semi-supervised learning","author":"berthelot","year":"2019","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.1996.560968"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-011-3352-0"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1109\/CISP.2008.278"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1364\/AO.53.004865"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1109\/ICDIP.2009.68"},{"key":"ref65","first-page":"402","article-title":"The cold rolling strip surface defect on-line inspection system based on machine vision","author":"jie","year":"2010","journal-title":"Proc 2nd Pacific-Asia Conf Circuits Commun Syst"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1109\/INMIC.2008.4777721"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2015.05.134"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1007\/s001380050130"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1155\/2013\/429094"},{"key":"ref69","doi-asserted-by":"publisher","DOI":"10.1109\/CIMCA.2008.130"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2013.09.002"},{"key":"ref109","doi-asserted-by":"publisher","DOI":"10.1016\/j.imavis.2019.06.008"},{"key":"ref95","first-page":"1","article-title":"Application of fractal dimensions based on the optimized scale to classification of surface defects on hot-rolled steel strips","volume":"168","author":"xu","year":"2008","journal-title":"Metallic Equipment"},{"key":"ref108","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2019.01.011"},{"key":"ref94","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2012.6252468"},{"key":"ref107","doi-asserted-by":"publisher","DOI":"10.1109\/ICIT.2017.7915495"},{"key":"ref93","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2005.177"},{"key":"ref106","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2018.12.043"},{"key":"ref92","doi-asserted-by":"publisher","DOI":"10.1007\/s13369-018-3329-5"},{"key":"ref105","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2013.6706920"},{"key":"ref91","doi-asserted-by":"publisher","DOI":"10.1155\/2013\/504895"},{"key":"ref104","doi-asserted-by":"publisher","DOI":"10.17222\/mit.2015.335"},{"key":"ref90","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2852918"},{"key":"ref103","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2019.2907932"},{"key":"ref102","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2019.105986"},{"key":"ref111","doi-asserted-by":"publisher","DOI":"10.1117\/12.530683"},{"key":"ref112","doi-asserted-by":"publisher","DOI":"10.1111\/j.1365-2818.2010.03365.x"},{"key":"ref110","doi-asserted-by":"publisher","DOI":"10.1002\/srin.201400016"},{"key":"ref98","doi-asserted-by":"publisher","DOI":"10.1109\/ICAL.2007.4338916"},{"key":"ref99","doi-asserted-by":"publisher","DOI":"10.1007\/s10044-004-0232-3"},{"key":"ref96","doi-asserted-by":"publisher","DOI":"10.1166\/jctn.2016.5539"},{"key":"ref97","doi-asserted-by":"publisher","DOI":"10.1016\/S1006-706X(13)60102-8"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2898215"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2017.10.020"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2963555"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2014.2318058"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2664480"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2013.2264508"},{"key":"ref118","doi-asserted-by":"publisher","DOI":"10.1007\/s11045-020-00720-5"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2017.2765364"},{"key":"ref82","doi-asserted-by":"publisher","DOI":"10.1109\/ICIEA.2012.6360951"},{"key":"ref117","doi-asserted-by":"publisher","DOI":"10.1007\/s12289-019-01496-1"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2017.2767185"},{"key":"ref81","doi-asserted-by":"publisher","DOI":"10.1186\/s13640-017-0197-y"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2917522"},{"key":"ref84","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2017.2668395"},{"key":"ref119","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2010.12.026"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.1982.4767309"},{"key":"ref83","doi-asserted-by":"publisher","DOI":"10.3390\/met7080311"},{"key":"ref114","doi-asserted-by":"publisher","DOI":"10.2355\/isijinternational.ISIJINT-2016-478"},{"key":"ref113","doi-asserted-by":"publisher","DOI":"10.1016\/S1006-706X(14)60027-3"},{"key":"ref116","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2019.05.005"},{"key":"ref80","first-page":"179","article-title":"Visual pattern recognition by moment invariants","volume":"it 8","author":"hu","year":"1962","journal-title":"IEEE Trans Inf Theory"},{"key":"ref115","doi-asserted-by":"publisher","DOI":"10.1016\/S1006-706X(07)60027-2"},{"key":"ref120","doi-asserted-by":"publisher","DOI":"10.1007\/s42243-018-0103-6"},{"key":"ref89","doi-asserted-by":"publisher","DOI":"10.1080\/08839514.2017.1378012"},{"key":"ref121","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2017.07.008"},{"key":"ref122","first-page":"267","article-title":"Surface defect recognition for steel strips by combining multiple classifiers","volume":"33","author":"zhang","year":"2012","journal-title":"J Northeast Univ"},{"key":"ref123","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTMA.2011.811"},{"key":"ref85","doi-asserted-by":"publisher","DOI":"10.3390\/app8091575"},{"key":"ref86","doi-asserted-by":"publisher","DOI":"10.3390\/met8030197"},{"key":"ref87","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2881962"},{"key":"ref88","doi-asserted-by":"publisher","DOI":"10.2355\/isijinternational.ISIJINT-2015-201"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9253032\/09220110.pdf?arnumber=9220110","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T15:01:06Z","timestamp":1651071666000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9220110\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,12]]},"references-count":137,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tim.2020.3030167","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,12]]}}}