{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,15]],"date-time":"2026-04-15T18:45:38Z","timestamp":1776278738898,"version":"3.50.1"},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/tim.2020.3031977","type":"journal-article","created":{"date-parts":[[2020,10,21]],"date-time":"2020-10-21T17:23:05Z","timestamp":1603300985000},"page":"1-10","source":"Crossref","is-referenced-by-count":12,"title":["Improved Method for Measuring Power Losses in the Inductor Core"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9857-8235","authenticated-orcid":false,"given":"Krzysztof","family":"Gorecki","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1584-3874","authenticated-orcid":false,"given":"Kalina","family":"Detka","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1002\/jnm.449"},{"key":"ref38","year":"2020","journal-title":"F-2001 Characteristics"},{"key":"ref33","author":"chua","year":"1975","journal-title":"Computer-Aided Analysis of Electronic Circuits Algorithm and computational techniques"},{"key":"ref32","first-page":"3","article-title":"Investigations on the influence of selected factors on thermal parameters of impulse-transformers","volume":"47","author":"g\u00f3recki","year":"2017","journal-title":"Inf Midem-J Microelectron Electron Components Mater"},{"key":"ref31","author":"tietze","year":"2015","journal-title":"Electronic Circuits Handbook for Design and Application"},{"key":"ref30","first-page":"52","article-title":"MADMIX: The standard for measuring SMPS inductors","volume":"10","author":"wens","year":"2015","journal-title":"Bodo’s Power Syst"},{"key":"ref37","year":"2020","journal-title":"Optex Product Information"},{"key":"ref36","author":"polyanin","year":"2003","journal-title":"Handbook of Exact Solutions for Ordinary Differential Equations"},{"key":"ref35","author":"bronsztejn","year":"1997","journal-title":"Matematyka Poradnik Encyklopedyczny"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1515\/mms-2015-0036"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2837657"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2555359"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2014.02.003"},{"key":"ref12","author":"jiles","year":"2016","journal-title":"Introduction to Magnetism and Magnetic Materials"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2002.802193"},{"key":"ref14","author":"tumanski","year":"2011","journal-title":"Handbook of Magnetic Measurements"},{"key":"ref15","author":"kazimierczuk","year":"2014","journal-title":"High-Frequency Magnetic Components"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1515\/msp-2017-0050"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2286830"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2011.5744590"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2573273"},{"key":"ref28","first-page":"1","article-title":"Ferrite core loss measurement issues and technique","author":"milutinov blaz","year":"2015","journal-title":"Proc 18th Int Power Electron Symp"},{"key":"ref4","author":"van den bossche","year":"2005","journal-title":"Inductors and Transformers for Power Electronics"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1515\/aee-2016-0044"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2628202"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/PESC.2004.1354851"},{"key":"ref29","first-page":"263","article-title":"Measurement technique of dissipated power in low-loss cores of inductive components","author":"gozdur","year":"2013","journal-title":"Proceedings of the Microtechnology and Thermal Problems in Electronics MICROTHERM"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1033\/1\/012004"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmmm.2015.04.033"},{"key":"ref7","author":"cullity","year":"2009","journal-title":"Introduction to Magnetic Materials"},{"key":"ref2","author":"basso","year":"2001","journal-title":"Switch-Mode Power Supply SPICE CookBook"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.4993718"},{"key":"ref1","author":"barlik","year":"2014","journal-title":"Energoelektronika—Elementy podzespo?y uk?ady"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2018.2798919"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2848109"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2017.2761127"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/CPE.2018.8372564"},{"key":"ref41","volume":"100","year":"2020","journal-title":"Evaluation of Measurement Data—Guide to the Expression of Uncertainty in Measurement"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/EPEC.2009.5420918"},{"key":"ref26","year":"2013","journal-title":"Soft Ferrites and Accessories Data Handbook"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1063\/1.2173955"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9259274\/09229138.pdf?arnumber=9229138","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:51:09Z","timestamp":1652194269000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9229138\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":41,"URL":"https:\/\/doi.org\/10.1109\/tim.2020.3031977","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021]]}}}